{"title":"通过重构增强功能验证的可见性和性能","authors":"Joshua Marantz","doi":"10.1145/277044.277083","DOIUrl":null,"url":null,"abstract":"Cycle simulators, in-circuit emulators, and hardware accelerators have made it possible to rapidly model the functionality of large digital designs. But these techniques provide limited visibility of internal design nodes, making debugging hard. Simulators run slowly when all nodes are traced. Emulators provide full visibility only with limited depth, or with greatly reduced speed. This paper discusses software techniques for increasing design visibility while reducing tracing overhead in simulation, and achieving 100% visibility in emulation without reducing speed or compromising depth.","PeriodicalId":221221,"journal":{"name":"Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175)","volume":"194 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"31","resultStr":"{\"title\":\"Enhanced visibility and performance in functional verification by reconstruction\",\"authors\":\"Joshua Marantz\",\"doi\":\"10.1145/277044.277083\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Cycle simulators, in-circuit emulators, and hardware accelerators have made it possible to rapidly model the functionality of large digital designs. But these techniques provide limited visibility of internal design nodes, making debugging hard. Simulators run slowly when all nodes are traced. Emulators provide full visibility only with limited depth, or with greatly reduced speed. This paper discusses software techniques for increasing design visibility while reducing tracing overhead in simulation, and achieving 100% visibility in emulation without reducing speed or compromising depth.\",\"PeriodicalId\":221221,\"journal\":{\"name\":\"Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175)\",\"volume\":\"194 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"31\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/277044.277083\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1998 Design and Automation Conference. 35th DAC. (Cat. No.98CH36175)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/277044.277083","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Enhanced visibility and performance in functional verification by reconstruction
Cycle simulators, in-circuit emulators, and hardware accelerators have made it possible to rapidly model the functionality of large digital designs. But these techniques provide limited visibility of internal design nodes, making debugging hard. Simulators run slowly when all nodes are traced. Emulators provide full visibility only with limited depth, or with greatly reduced speed. This paper discusses software techniques for increasing design visibility while reducing tracing overhead in simulation, and achieving 100% visibility in emulation without reducing speed or compromising depth.