{"title":"基于D-Q轴表示的双馈感应电机匝间短路检测","authors":"H. Bilal, N. Héraud, Eric Jean Roy Sambatra","doi":"10.1109/RTUCON51174.2020.9316591","DOIUrl":null,"url":null,"abstract":"In this paper, we propose to detect and quantify the fault of inter-turn short-circuit in the winding of a Doubly Fed Induction Machine (DFIM). This is essential to detect this type of defect at an early stage because this one can produce damage to the machine. So, we must be able firstly to detect the fault and secondly to quantify its severity. Our study responds to this and necessities a few calculi. We present in this paper a low sample time (1kHz), and we offer theoretical analysis with a model of our DFIM without fault, and a model included this fault. An analysis of the representation on the D-Q basis is done. After, we confirm these results through the exploitation of a platform which comprises a DFIM and a Data Acquisition (DAQ) system. The obtained results are rather hopeful.","PeriodicalId":332414,"journal":{"name":"2020 IEEE 61th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2020-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Detection of inter-turn short-circuit on a Doubly Fed Induction Machine with D-Q axis representation\",\"authors\":\"H. Bilal, N. Héraud, Eric Jean Roy Sambatra\",\"doi\":\"10.1109/RTUCON51174.2020.9316591\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we propose to detect and quantify the fault of inter-turn short-circuit in the winding of a Doubly Fed Induction Machine (DFIM). This is essential to detect this type of defect at an early stage because this one can produce damage to the machine. So, we must be able firstly to detect the fault and secondly to quantify its severity. Our study responds to this and necessities a few calculi. We present in this paper a low sample time (1kHz), and we offer theoretical analysis with a model of our DFIM without fault, and a model included this fault. An analysis of the representation on the D-Q basis is done. After, we confirm these results through the exploitation of a platform which comprises a DFIM and a Data Acquisition (DAQ) system. The obtained results are rather hopeful.\",\"PeriodicalId\":332414,\"journal\":{\"name\":\"2020 IEEE 61th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-11-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE 61th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RTUCON51174.2020.9316591\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 61th International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RTUCON51174.2020.9316591","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Detection of inter-turn short-circuit on a Doubly Fed Induction Machine with D-Q axis representation
In this paper, we propose to detect and quantify the fault of inter-turn short-circuit in the winding of a Doubly Fed Induction Machine (DFIM). This is essential to detect this type of defect at an early stage because this one can produce damage to the machine. So, we must be able firstly to detect the fault and secondly to quantify its severity. Our study responds to this and necessities a few calculi. We present in this paper a low sample time (1kHz), and we offer theoretical analysis with a model of our DFIM without fault, and a model included this fault. An analysis of the representation on the D-Q basis is done. After, we confirm these results through the exploitation of a platform which comprises a DFIM and a Data Acquisition (DAQ) system. The obtained results are rather hopeful.