通过多变量质量跟踪,跟踪最佳测试组合

B. Arslan, A. Orailoglu
{"title":"通过多变量质量跟踪,跟踪最佳测试组合","authors":"B. Arslan, A. Orailoglu","doi":"10.1109/VTS.2013.6548886","DOIUrl":null,"url":null,"abstract":"The increasing multiplicity of defect types forces the inclusion of tests from a variety of fault models. The quest for test quality is checkmated though by the considerable and frequently unnecessary cost of the large number of tests, driven by the lack of a clear correspondence between defects and fault models. While the static derivation of the appropriate test mixes from a variety of fault models to deliver high test quality at low cost is a desirable goal, it is challenged by the frequent changes in defect characteristics. The consequent necessity for adaptivity is addressed in this paper through a test framework that utilizes the continuous stream of failing test data during production testing to track the varying test quality based on evolving defect characteristics and thus dynamically adjust the production test set to deliver a target defect escape level at minimal test cost.","PeriodicalId":138435,"journal":{"name":"2013 IEEE 31st VLSI Test Symposium (VTS)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Tracing the best test mix through multi-variate quality tracking\",\"authors\":\"B. Arslan, A. Orailoglu\",\"doi\":\"10.1109/VTS.2013.6548886\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The increasing multiplicity of defect types forces the inclusion of tests from a variety of fault models. The quest for test quality is checkmated though by the considerable and frequently unnecessary cost of the large number of tests, driven by the lack of a clear correspondence between defects and fault models. While the static derivation of the appropriate test mixes from a variety of fault models to deliver high test quality at low cost is a desirable goal, it is challenged by the frequent changes in defect characteristics. The consequent necessity for adaptivity is addressed in this paper through a test framework that utilizes the continuous stream of failing test data during production testing to track the varying test quality based on evolving defect characteristics and thus dynamically adjust the production test set to deliver a target defect escape level at minimal test cost.\",\"PeriodicalId\":138435,\"journal\":{\"name\":\"2013 IEEE 31st VLSI Test Symposium (VTS)\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-04-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE 31st VLSI Test Symposium (VTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTS.2013.6548886\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 31st VLSI Test Symposium (VTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTS.2013.6548886","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

缺陷类型的增加的多样性迫使包含来自各种故障模型的测试。尽管由于缺陷和故障模型之间缺乏明确的对应关系,大量测试的大量且经常是不必要的成本导致了对测试质量的追求。虽然从各种故障模型中静态地推导出适当的测试混合,以低成本交付高测试质量是一个理想的目标,但它受到缺陷特征频繁变化的挑战。本文通过一个测试框架解决了适应性的必要性,该测试框架利用生产测试期间失败测试数据的连续流来跟踪基于不断发展的缺陷特征的变化测试质量,从而动态调整生产测试集,以最小的测试成本交付目标缺陷逃逸级别。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Tracing the best test mix through multi-variate quality tracking
The increasing multiplicity of defect types forces the inclusion of tests from a variety of fault models. The quest for test quality is checkmated though by the considerable and frequently unnecessary cost of the large number of tests, driven by the lack of a clear correspondence between defects and fault models. While the static derivation of the appropriate test mixes from a variety of fault models to deliver high test quality at low cost is a desirable goal, it is challenged by the frequent changes in defect characteristics. The consequent necessity for adaptivity is addressed in this paper through a test framework that utilizes the continuous stream of failing test data during production testing to track the varying test quality based on evolving defect characteristics and thus dynamically adjust the production test set to deliver a target defect escape level at minimal test cost.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信