H. Inokawa, T. Nishimura, Alka Singh, H. Satoh, Yasuo Takahashi
{"title":"单电子晶体管的超高频特性","authors":"H. Inokawa, T. Nishimura, Alka Singh, H. Satoh, Yasuo Takahashi","doi":"10.1109/EDSSC.2018.8487153","DOIUrl":null,"url":null,"abstract":"High-frequency rectifying characteristics of single-electron transistor (SET) is analyzed by simulation based on the time-dependent master equation. The experimental finding of the operation far beyond the conventional cutoff frequency set by the CR time constant is reconfirmed successfully, and the mechanism behind the phenomena is clarified. The result strongly suggests that SET becomes an important rectifier at ultrahigh frequencies where conventional devices cannot operate.","PeriodicalId":279745,"journal":{"name":"2018 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Ultrahigh-Frequency Characteristics of Single-Electron Transistor\",\"authors\":\"H. Inokawa, T. Nishimura, Alka Singh, H. Satoh, Yasuo Takahashi\",\"doi\":\"10.1109/EDSSC.2018.8487153\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"High-frequency rectifying characteristics of single-electron transistor (SET) is analyzed by simulation based on the time-dependent master equation. The experimental finding of the operation far beyond the conventional cutoff frequency set by the CR time constant is reconfirmed successfully, and the mechanism behind the phenomena is clarified. The result strongly suggests that SET becomes an important rectifier at ultrahigh frequencies where conventional devices cannot operate.\",\"PeriodicalId\":279745,\"journal\":{\"name\":\"2018 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC)\",\"volume\":\"11 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDSSC.2018.8487153\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDSSC.2018.8487153","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Ultrahigh-Frequency Characteristics of Single-Electron Transistor
High-frequency rectifying characteristics of single-electron transistor (SET) is analyzed by simulation based on the time-dependent master equation. The experimental finding of the operation far beyond the conventional cutoff frequency set by the CR time constant is reconfirmed successfully, and the mechanism behind the phenomena is clarified. The result strongly suggests that SET becomes an important rectifier at ultrahigh frequencies where conventional devices cannot operate.