在石墨烯上湿蚀刻金以获得高质量的无电阻石墨烯表面

J. Kunc, M. Shestopalov, J. Jo, Kibog Park
{"title":"在石墨烯上湿蚀刻金以获得高质量的无电阻石墨烯表面","authors":"J. Kunc, M. Shestopalov, J. Jo, Kibog Park","doi":"10.1088/2632-959X/acef45","DOIUrl":null,"url":null,"abstract":"Wet etching of gold on graphene is challenging due to the weak adhesion of the resist mask to graphene. We report an operating procedure for alkali ion-free wet etching of gold on graphene using a mixture of hydrochloric and nitric acids (aqua regia) with a high lateral resolution down to 100 nm. We investigate the role of positive and negative resists, electron beam lithography (EBL) dose, hard-bake, oxygen etching, aging, and sensitivity to the etch parameters, such as the freshness of dilute aqua regia, etch time, and the order of etched samples. The negative-tone resist provides the best results. The over-dosed EBL exposure can enhance the resist adhesion, as hard-bake below the glass-transition temperature and well-defined wet etch of the resist-residua-free gold surface. We also present a cleaning procedure to avoid bubble formation after the hard bake. Our results demonstrate that wet etching of gold on graphene using aqua regia is a viable method for achieving high-quality resist-free graphene surfaces. This method has potential applications in graphene nanoelectronics and nanophotonics, where high-quality graphene surfaces are essential for device performance.","PeriodicalId":118165,"journal":{"name":"Nano Express","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-08-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Wet etching of gold on graphene for high-quality resist-free graphene surfaces\",\"authors\":\"J. Kunc, M. Shestopalov, J. Jo, Kibog Park\",\"doi\":\"10.1088/2632-959X/acef45\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Wet etching of gold on graphene is challenging due to the weak adhesion of the resist mask to graphene. We report an operating procedure for alkali ion-free wet etching of gold on graphene using a mixture of hydrochloric and nitric acids (aqua regia) with a high lateral resolution down to 100 nm. We investigate the role of positive and negative resists, electron beam lithography (EBL) dose, hard-bake, oxygen etching, aging, and sensitivity to the etch parameters, such as the freshness of dilute aqua regia, etch time, and the order of etched samples. The negative-tone resist provides the best results. The over-dosed EBL exposure can enhance the resist adhesion, as hard-bake below the glass-transition temperature and well-defined wet etch of the resist-residua-free gold surface. We also present a cleaning procedure to avoid bubble formation after the hard bake. Our results demonstrate that wet etching of gold on graphene using aqua regia is a viable method for achieving high-quality resist-free graphene surfaces. This method has potential applications in graphene nanoelectronics and nanophotonics, where high-quality graphene surfaces are essential for device performance.\",\"PeriodicalId\":118165,\"journal\":{\"name\":\"Nano Express\",\"volume\":\"8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-08-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Nano Express\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1088/2632-959X/acef45\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nano Express","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/2632-959X/acef45","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

由于抗蚀剂掩膜与石墨烯的附着力较弱,在石墨烯上湿法蚀刻金具有挑战性。我们报告了一种使用盐酸和硝酸(王水)的混合物在石墨烯上无碱离子湿法蚀刻金的操作程序,其横向分辨率高至100 nm。我们研究了正负抗蚀剂、电子束光刻(EBL)剂量、硬烘烤、氧蚀刻、老化和敏感性对蚀刻参数的影响,如稀释王水的新鲜度、蚀刻时间和蚀刻样品的顺序。负色调抗蚀剂提供最好的效果。过量的EBL暴露可以增强抗附着力,因为在玻璃化转变温度下硬烘烤和无抗残余金表面的明确的湿蚀刻。我们还介绍了一种清洗程序,以避免在硬烤后形成气泡。我们的研究结果表明,使用王水在石墨烯上湿蚀刻金是实现高质量无电阻石墨烯表面的可行方法。这种方法在石墨烯纳米电子学和纳米光子学中有潜在的应用,在这些领域,高质量的石墨烯表面对器件性能至关重要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Wet etching of gold on graphene for high-quality resist-free graphene surfaces
Wet etching of gold on graphene is challenging due to the weak adhesion of the resist mask to graphene. We report an operating procedure for alkali ion-free wet etching of gold on graphene using a mixture of hydrochloric and nitric acids (aqua regia) with a high lateral resolution down to 100 nm. We investigate the role of positive and negative resists, electron beam lithography (EBL) dose, hard-bake, oxygen etching, aging, and sensitivity to the etch parameters, such as the freshness of dilute aqua regia, etch time, and the order of etched samples. The negative-tone resist provides the best results. The over-dosed EBL exposure can enhance the resist adhesion, as hard-bake below the glass-transition temperature and well-defined wet etch of the resist-residua-free gold surface. We also present a cleaning procedure to avoid bubble formation after the hard bake. Our results demonstrate that wet etching of gold on graphene using aqua regia is a viable method for achieving high-quality resist-free graphene surfaces. This method has potential applications in graphene nanoelectronics and nanophotonics, where high-quality graphene surfaces are essential for device performance.
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CiteScore
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