{"title":"测量计算机系统及其程序","authors":"Bertram Bussell, R. A. Koster","doi":"10.1145/1478462.1478538","DOIUrl":null,"url":null,"abstract":"Considering the high cost and sophistication of data processing equipment, it is almost incredible that techniques for computer system measurement and evaluation have lagged so far behind. While it is true that computer technology has advanced at a rapid rate during the past 20 years, it is surprising that instrumentation for displaying system efficiency has only recently been given exposure in the literature; and even that literature is sparse.","PeriodicalId":438698,"journal":{"name":"AFIPS '70 (Fall)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1899-12-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Instrumenting computer systems and their programs\",\"authors\":\"Bertram Bussell, R. A. Koster\",\"doi\":\"10.1145/1478462.1478538\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Considering the high cost and sophistication of data processing equipment, it is almost incredible that techniques for computer system measurement and evaluation have lagged so far behind. While it is true that computer technology has advanced at a rapid rate during the past 20 years, it is surprising that instrumentation for displaying system efficiency has only recently been given exposure in the literature; and even that literature is sparse.\",\"PeriodicalId\":438698,\"journal\":{\"name\":\"AFIPS '70 (Fall)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1899-12-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"AFIPS '70 (Fall)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1478462.1478538\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"AFIPS '70 (Fall)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1478462.1478538","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Considering the high cost and sophistication of data processing equipment, it is almost incredible that techniques for computer system measurement and evaluation have lagged so far behind. While it is true that computer technology has advanced at a rapid rate during the past 20 years, it is surprising that instrumentation for displaying system efficiency has only recently been given exposure in the literature; and even that literature is sparse.