碳纳米管晶体管中的雪崩、焦耳击穿和磁滞

2009 IEEE International Reliability Physics Symposium Pub Date : 2009-04-26 DOI:10.1109/IRPS.2009.5173287

E. Pop, S. Dutta, D. Estrada, A. Liao

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引用次数: 9

摘要

我们探讨了碳纳米管晶体管可靠性的几个方面，包括它们对直径的物理依赖性。在高场(5-10 V/μm)条件下发现了雪崩行为，而在氧气存在的大电流和加热条件下则达到焦耳击穿。最后，我们描述了一种通过脉冲测量最小化迟滞效应的方法。

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Avalanche, joule breakdown and hysteresis in carbon nanotube transistors

We explore several aspects of reliability in carbon nanotube transistors, including their physical dependence on diameter. Avalanche behavior is found at high fields (5–10 V/μm), while Joule breakdown is reached at high current and heating, in the presence of oxygen. Finally, we describe a method for minimizing hysteresis effects via pulsed measurements.

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2009 IEEE International Reliability Physics Symposium

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