2009 IEEE International Reliability Physics Symposium

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2009 IEEE International Reliability Physics Symposium - 最新文献

Life-stress relationship for thin film transistor gate line interconnects on flexible substrates

Pub Date : 2010-02-23 DOI: 10.1117/12.840044 T. Martin, A. Christou

Dual nature of metal gate electrode effects on BTI and dielectric breakdown in TaC/HfSiON MISFETs

Pub Date : 2009-04-26 DOI: 10.1109/IRPS.2009.5173280 S. Fukatsu, I. Hirano, K. Tatsumura, Akiko Masada, S. Fujii, Y. Mitani, M. Goto, S. Inumiya, K. Nakajima, S. Kawanaka, T. Aoyama

The correlation between trap states and mechanical reliability of amorphous Si:H TFTs for flexible electronics

Pub Date : 2009-04-26 DOI: 10.1109/IRPS.2009.5173388 M. H. Lee, S. T. Chang, S. Weng, W.H. Liu, K.-J. Chen, K. Ho, M. Liao, J.-J. Huang, G. Hu

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