Takahiro J. Yamaguchi, M. Soma, M. Ishida, M. Kurosawa, H. Musha
{"title":"电缆确定性抖动对抖动公差测量的影响","authors":"Takahiro J. Yamaguchi, M. Soma, M. Ishida, M. Kurosawa, H. Musha","doi":"10.1109/TEST.2003.1270825","DOIUrl":null,"url":null,"abstract":"This paper presents a new jitter tolerance model that includes the effect of deterministic jitter in interconnects. First, it is shown by experiment that the deterministic jitter in a cable can significantly affect its jitter tolerance. Then, the new jitter tolerance model is verified with experimental data on cables of various lengths, using both PRBS and T11 test patterns.","PeriodicalId":236182,"journal":{"name":"International Test Conference, 2003. Proceedings. ITC 2003.","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"Effects of deterministic jitter in a cable on jitter tolerance measurements\",\"authors\":\"Takahiro J. Yamaguchi, M. Soma, M. Ishida, M. Kurosawa, H. Musha\",\"doi\":\"10.1109/TEST.2003.1270825\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new jitter tolerance model that includes the effect of deterministic jitter in interconnects. First, it is shown by experiment that the deterministic jitter in a cable can significantly affect its jitter tolerance. Then, the new jitter tolerance model is verified with experimental data on cables of various lengths, using both PRBS and T11 test patterns.\",\"PeriodicalId\":236182,\"journal\":{\"name\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-09-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Test Conference, 2003. Proceedings. ITC 2003.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2003.1270825\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Test Conference, 2003. Proceedings. ITC 2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2003.1270825","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Effects of deterministic jitter in a cable on jitter tolerance measurements
This paper presents a new jitter tolerance model that includes the effect of deterministic jitter in interconnects. First, it is shown by experiment that the deterministic jitter in a cable can significantly affect its jitter tolerance. Then, the new jitter tolerance model is verified with experimental data on cables of various lengths, using both PRBS and T11 test patterns.