{"title":"相移测量的数字方法","authors":"R. Ivantsiv, U. Maricutsa, T. Sviridova, M. Lobur","doi":"10.1109/MIXDES.2006.1706644","DOIUrl":null,"url":null,"abstract":"The devices used for measuring the phase shift have been reviewed in this article. The measurement fault of the phase shift with the value 3deg for the frequency 30 kHz at the quantization frequency value 100 mHz has been defined; the structural scheme of the phase meter with frequency multiplier for 36 has been suggested","PeriodicalId":318768,"journal":{"name":"Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006.","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Digital Method Of Phase Shift Measuring\",\"authors\":\"R. Ivantsiv, U. Maricutsa, T. Sviridova, M. Lobur\",\"doi\":\"10.1109/MIXDES.2006.1706644\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The devices used for measuring the phase shift have been reviewed in this article. The measurement fault of the phase shift with the value 3deg for the frequency 30 kHz at the quantization frequency value 100 mHz has been defined; the structural scheme of the phase meter with frequency multiplier for 36 has been suggested\",\"PeriodicalId\":318768,\"journal\":{\"name\":\"Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006.\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-06-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MIXDES.2006.1706644\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the International Conference Mixed Design of Integrated Circuits and System, 2006. MIXDES 2006.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MIXDES.2006.1706644","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The devices used for measuring the phase shift have been reviewed in this article. The measurement fault of the phase shift with the value 3deg for the frequency 30 kHz at the quantization frequency value 100 mHz has been defined; the structural scheme of the phase meter with frequency multiplier for 36 has been suggested