{"title":"微控制器电磁抗扰孔的起源","authors":"Tao Su, T. Steinecke, M. Unger","doi":"10.1109/EDAPS.2010.5683027","DOIUrl":null,"url":null,"abstract":"This paper describes the origins of one kind of the degradation of the electromagnetic immunity of microcontrollers. That immunityy degradation is strongly frequency dependent. They appear like holes in immunity-frequency curve. Mechanism based on resonance in two types of current loops is introduced to explain the formation of those immunity holes. Measurement results are given to support the introduced theory.","PeriodicalId":185326,"journal":{"name":"2010 IEEE Electrical Design of Advanced Package & Systems Symposium","volume":"121 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Origins of electromagnetic immunity holes of microcontrollers\",\"authors\":\"Tao Su, T. Steinecke, M. Unger\",\"doi\":\"10.1109/EDAPS.2010.5683027\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the origins of one kind of the degradation of the electromagnetic immunity of microcontrollers. That immunityy degradation is strongly frequency dependent. They appear like holes in immunity-frequency curve. Mechanism based on resonance in two types of current loops is introduced to explain the formation of those immunity holes. Measurement results are given to support the introduced theory.\",\"PeriodicalId\":185326,\"journal\":{\"name\":\"2010 IEEE Electrical Design of Advanced Package & Systems Symposium\",\"volume\":\"121 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE Electrical Design of Advanced Package & Systems Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EDAPS.2010.5683027\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE Electrical Design of Advanced Package & Systems Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDAPS.2010.5683027","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Origins of electromagnetic immunity holes of microcontrollers
This paper describes the origins of one kind of the degradation of the electromagnetic immunity of microcontrollers. That immunityy degradation is strongly frequency dependent. They appear like holes in immunity-frequency curve. Mechanism based on resonance in two types of current loops is introduced to explain the formation of those immunity holes. Measurement results are given to support the introduced theory.
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