专门用于多模粘合工艺的新型预应用下填充材料

Masashi Okaniwa, Takenori Takiguchi, Kohei Higashiguchi, Takahito Sekido, K. Ihara, Tsuyoshi Kida, Shuuji Yoshida, T. Oshima
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引用次数: 1

摘要

NCF (Non - Conductive Film)的TCB (Thermal Compression Bonding)工艺有望成为物联网(IoT)发展带来的小间距应用的有效解决方案,但由于其昂贵的组装成本,其产量限制在小水平。为了降低成本影响,许多厂商正在引入一些多模接合方法。到目前为止,对这些粘合过程的几种nfc进行了评估,不幸的是,越来越明显的是,由于树脂的反应性和工艺条件之间的不匹配,与传统热固性树脂组合物相结合的方法很难达到粘合过程所需的工艺能力。这就是为什么市场上需要专门用于多模粘合过程的新型预应用下填充材料的原因,并且在本研究中已经开发出来。所开发的NCF可以在TCB键合机的键合阶段经受长时间的热暴露,从而可以在足够的工艺裕度下成功地进行多模键合(如集体键合)。为了达到目标规格,本研究已经开始设计应用于开发的NCF的新树脂组合物。最后,利用开发的NCF验证了TCB,并证实在焊接阶段在130℃下热暴露180min后,形成了可靠的焊点,没有观察到异常。此外,所开发的NCF在HAST中表现出良好的绝缘可靠性。包级的最终可靠性测试正在进行中,很快就会看到结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Novel Pre-applied Under-fill Material Specialized for Multiple Die Bonding Process
TCB (Thermal Compression Bonding) process with NCF (Non Conductive Film) is expected as an effective solution for fine pitch applications brought by the progress of IoT (Internet of Things), however the production volume is limited to small level because of its expensive assembly cost. To mitigate the cost impact, some multiple die bonding methods are being introduced by many players. So far, several NCFs were evaluated for these bonding processes, unfortunately, it is becoming clear that approaches coupled with conventional thermosetting resin compositions are very difficult to achieve required process-ability of the bonding processes due to miss-match between reactivity of the resins and process conditions. That is why the new type of pre-applied under-fill material specialized for multiple die bonding process was desired in the market and has been developed in this study. The developed NCF was designed to survive long time thermal exposure on a bonding stage of TCB bonder so that multiple die bonding such as collective bonding could be successfully performed with enough process margin. To achieve the target specifications, this study has started with the design of new resin composition applied to the developed NCF. Finally, TCB was demonstrated with the developed NCF and it was confirmed that reliable solder joints were formed and no abnormality was observed even after 180mins thermal exposure at 130degC on the bonding stage. Moreover, the developed NCF showed good insulation reliability in HAST. The final reliability tests on package level are ongoing and the results will be visible in no time.
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