Intersil ISL71090SEH和ISL71091SEH精密电压基准的总剂量和单事件效应测试

2014 IEEE Radiation Effects Data Workshop (REDW) Pub Date : 2014-07-14 DOI:10.1109/REDW.2014.7004604

N. V. Vonno, B. Williams, S. D. Turner, E. Thomson, Serge Bernard, D. Goodhew

{"title":"Intersil ISL71090SEH和ISL71091SEH精密电压基准的总剂量和单事件效应测试","authors":"N. V. Vonno, B. Williams, S. D. Turner, E. Thomson, Serge Bernard, D. Goodhew","doi":"10.1109/REDW.2014.7004604","DOIUrl":null,"url":null,"abstract":"We report the results of SEE and low and high dose rate total dose testing of the Intersil ISL71090SEH and ISL71091SEH hardened voltage references together with a discussion of electrical specifications and fabrication process.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"87 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Total Dose and Single Event Effects Testing of the Intersil ISL71090SEH and ISL71091SEH Precision Voltage References\",\"authors\":\"N. V. Vonno, B. Williams, S. D. Turner, E. Thomson, Serge Bernard, D. Goodhew\",\"doi\":\"10.1109/REDW.2014.7004604\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report the results of SEE and low and high dose rate total dose testing of the Intersil ISL71090SEH and ISL71091SEH hardened voltage references together with a discussion of electrical specifications and fabrication process.\",\"PeriodicalId\":223557,\"journal\":{\"name\":\"2014 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"87 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-07-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW.2014.7004604\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.2014.7004604","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 5

摘要

我们报告了Intersil ISL71090SEH和ISL71091SEH硬化电压基准的SEE和低剂量率和高剂量率总剂量测试结果，并讨论了电气规格和制造工艺。

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Total Dose and Single Event Effects Testing of the Intersil ISL71090SEH and ISL71091SEH Precision Voltage References

We report the results of SEE and low and high dose rate total dose testing of the Intersil ISL71090SEH and ISL71091SEH hardened voltage references together with a discussion of electrical specifications and fabrication process.

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来源期刊

2014 IEEE Radiation Effects Data Workshop (REDW)

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