S. Atsumi, A. Umezawa, M. Kuriyama, H. Banba, N. Ohtsuka, N. Tomita, Y. Iyama, T. Miyaba, R. Sudoh, E. Kamiya, M. Tanimoto, Y. Hiura, Y. Araki, E. Sakagami, N. Arai, S. Mori
{"title":"3.3 v - 16mb带行解码方案的闪存","authors":"S. Atsumi, A. Umezawa, M. Kuriyama, H. Banba, N. Ohtsuka, N. Tomita, Y. Iyama, T. Miyaba, R. Sudoh, E. Kamiya, M. Tanimoto, Y. Hiura, Y. Araki, E. Sakagami, N. Arai, S. Mori","doi":"10.1109/ISSCC.1996.488506","DOIUrl":null,"url":null,"abstract":"A 3.3 V only 16 M flash memory with a row decoding scheme is fabricated in 0.4 /spl mu/m double-well double-metal CMOS. Negative-gate-biased erase enables 3.3 V-only operation, and a double-word-line structure with second aluminum minimizes word-line delay. Row redundancy with self-convergence improves yield. Quasi-differential sensing with address transition detection gives fast random access.","PeriodicalId":162539,"journal":{"name":"1996 IEEE International Solid-State Circuits Conference. Digest of TEchnical Papers, ISSCC","volume":"297 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-02-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"A 3.3 V-only 16 Mb flash memory with row-decoding scheme\",\"authors\":\"S. Atsumi, A. Umezawa, M. Kuriyama, H. Banba, N. Ohtsuka, N. Tomita, Y. Iyama, T. Miyaba, R. Sudoh, E. Kamiya, M. Tanimoto, Y. Hiura, Y. Araki, E. Sakagami, N. Arai, S. Mori\",\"doi\":\"10.1109/ISSCC.1996.488506\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 3.3 V only 16 M flash memory with a row decoding scheme is fabricated in 0.4 /spl mu/m double-well double-metal CMOS. Negative-gate-biased erase enables 3.3 V-only operation, and a double-word-line structure with second aluminum minimizes word-line delay. Row redundancy with self-convergence improves yield. Quasi-differential sensing with address transition detection gives fast random access.\",\"PeriodicalId\":162539,\"journal\":{\"name\":\"1996 IEEE International Solid-State Circuits Conference. Digest of TEchnical Papers, ISSCC\",\"volume\":\"297 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-02-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1996 IEEE International Solid-State Circuits Conference. Digest of TEchnical Papers, ISSCC\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.1996.488506\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 IEEE International Solid-State Circuits Conference. Digest of TEchnical Papers, ISSCC","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1996.488506","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 3.3 V-only 16 Mb flash memory with row-decoding scheme
A 3.3 V only 16 M flash memory with a row decoding scheme is fabricated in 0.4 /spl mu/m double-well double-metal CMOS. Negative-gate-biased erase enables 3.3 V-only operation, and a double-word-line structure with second aluminum minimizes word-line delay. Row redundancy with self-convergence improves yield. Quasi-differential sensing with address transition detection gives fast random access.