光照对(Cs,O)活化GaAs光电阴极的影响

Li Min, D. Xiaoqing, Du Yujie, Chang Benkang, Fu Rongguo, Gao Ping
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引用次数: 1

摘要

前人研究了光照对(Cs,O)活化GaAs(110)光电阴极的影响。结果表明,在没有光照的情况下激活的GaAs光电阴极,在适当强度的光照下,其光敏度会在几分钟内达到一个新的最大值,而过强的光照则会使光敏度降低。我们还利用自行研制的光谱响应测试仪器,对不同光照强度下的GaAs光电阴极进行了稳定性和回收率的研究,分别将其密封在像增强器中和放置在特高压腔室中。我们发现,当光电阴极密封在弱光照射的像增强器中时,光敏度先上升到一个新的最大值,然后又下降。在去除光线几个小时后,光敏性可以自行恢复。与弱光照条件下相比,强光照条件下光电阴极的光敏度单调下降且无法恢复。通过对在特高压室中活化成功的光电阴极的另一实验,我们发现了一些新的现象。单调退化不仅由强光照引起,而且也由弱光照引起。光照后光敏性不可恢复。我们观察到的最重要的现象之一是特高压系统的压力强度随光照强度的变化而变化。光照越强,在开始的几分钟内,真空室的压力越大。本文对上述现象进行了分析和探讨。结果表明,入射光子诱导的过量少数载流子会破坏(Cs,O)活化GaAs光电阴极的表面组成和结构。根据我们的研究,提出了提高光电稳定性的有效解决方案。在我们的讨论中,偶极子模型得到了强有力的支持。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Influences of light illumination on (Cs,O) activated GaAs photocathode
Some experiments were made on the effects of light illumination on the (Cs,O) activated GaAs(110) photocathode in previous work. It was observed that if the GaAs photocathode activated without illumination were illuminated by light of proper intensities, its photosensitivity would increase to a new maximum in several minutes and that too intensive illumination could decrease the photosensitivity on the contrary. We also made a stability and recovery study of GaAs photocathodes under varies intensities illumination, which was sealed in image intensifier and placed in UHV chamber respectively, with the help of the self-developed spectral response testing instruments. We found that when the photocathode sealed in the image intensifier illuminated by light of weak intensities, the photosensitivity first increased to a new maximum and then decreased. After removing the light for several hours, the photosensitivity can be recovered itself. Contrast to the weak illumination case, the photosensitivity of photocathode under intensive illumination would decrease monotonously and could not be recovered. By another experiment on photocathode that had been activated successfully in the UHV chamber, we found some new phenomena. Monotonous degradation is produced not only by intensive illumination, but also by weak illumination. Furthermore, photosensitivity after illuminating was unrecoverable. One of the most important phenomena observed by us was that the intensity of pressure in UHV system varied with the intense of illumination. The more intense the illumination was, the more intense would be the pressure in vacuum chamber in the several minutes of beginning. In this paper, the phenomena above-mentioned are analyzed and discussed. It is suggested that excess minority carrier induced by incident photons would damage the surface composition and structure of (Cs,O) activated GaAs photocathode. According to our research, an effective solution to increase photoemission stability is put forward. In our discussion the dipole model is strongly supported.
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