采用动态模拟电路的高速低功耗ADC设计

A. Matsuzawa
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引用次数: 16

摘要

本文讨论了基于动态模拟电路的高速低功耗ADC设计。基于OpAmp的ADC设计在纳米CMOS时代不再有用,随着技术的扩展,基于比较器的ADC设计成为ADC设计的主导。比较器中的偏置失配和输入参考噪声严重影响ENOB。此外,ENOB在转换速度、能耗和占用面积方面存在严重的权衡。一种数字偏移失配补偿技术适应这种权衡,但精度是不够的,应该开发更有效的技术。推导了动态比较器输入参考噪声的估计公式,提出了通过增大负载电容和降低有效栅极电压来降低噪声的方法。然而,高于10位的分辨率看起来并不容易。实现更高分辨率的ADC1需要技术的发展。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High speed and low power ADC design with dynamic analog circuits
This paper discusses high speed and low power ADC design with dynamic analog circuits. An OpAmp based ADC design is no longer useful in nano-meter CMOS era and a comparator based ADC design becomes dominant for ADC design along with technology scaling. Offset mismatch and input referred noise in a comparator affects ENOB seriously. Furthermore conversion speed, energy consumption and occupied area have a serious tradeoff in ENOB. A digital offset mismatch compensation technique accommodates this trade off, however accuracy is not sufficient and more effective technique should be developed. An equation to estimate the input referred noise in dynamic comparator has been deduced and it suggests that the noise can be reduce by increase of load capacitance and reduction of the effective gate voltage. However higher resolution than 10 bit looks not easy. Technology development is required to realize higher resolution ADC1.
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