伽马辐射探测用金属氧化物薄膜/结构

2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS) Pub Date : 2015-12-01 DOI:10.1109/ICECS.2015.7440409

A. Omar, A. Baraka, A. Zaki, K. Sharshar

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引用次数: 0

摘要

本文采用多种沉积技术制备了用于伽马辐射剂量测定的氧化铝、氧化镍薄膜。在暴露于高和低伽马辐射剂量时，观察到沉积膜的(I-V)测量值发生了显著变化，p-n结膜结构证明了这些氧化膜在伽马辐射剂量学应用中的有前途的特性。

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Metal oxide films/structures for gamma radiation detection

In this work, aluminum oxide, nickel oxide films were prepared for the purpose of gamma radiation dosimetry using several deposition techniques. A significant change in the (I-V) measurements for the as deposited films, p-n junction film structures have been observed upon exposure to high and low gamma radiation doses which proofs the promising characteristics of these oxide films for gamma radiation dosimetry applications.

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2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)

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