单片高分辨率D/A转换器的自校准技术

IEEE International Solid-State Circuits Conference, 1989 ISSCC. Digest of Technical Papers Pub Date : 1989-02-15 DOI:10.1109/ISSCC.1989.48217

D. Groeneveld, H. Schouwenaars, H. Termeer, C. Bastiaansen

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引用次数: 215

摘要

提出了A/D /A(数字/模拟)和A/D(模拟/数字)自校准技术，该技术不需要校准周期，额外的修剪或外部组件，并且对工艺变化不敏感。该技术基于对电流源的校准。给出了一个16位数模转换器的基本框图。给出了常用的标定电路。测量的信噪比(包括谐波失真)与16位DAC输出电压的关系如图所示。

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A self calibration technique for monolithic high-resolution D/A converters

A D/A (digital/analog) and A/D (analog/digital) self-calibrated technique is presented which does not need a calibration period, additional trimming, or external component and is insensitive to process variations. The technique is based on calibration of a current source. The basic block diagram of a 16-bit D/A converter is shown. The common calibration circuitry is also presented. The measured signal-to-noise ratio, including harmonic distortion, versus the output voltage of the 16-bit DAC is shown.<>

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IEEE International Solid-State Circuits Conference, 1989 ISSCC. Digest of Technical Papers

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