{"title":"商业和辐射耐受运算放大器的单事件闭锁和总电离剂量试验结果汇编","authors":"F. Irom, S. Agarwal, Mehran Amrbar","doi":"10.1109/REDW.2014.7004561","DOIUrl":null,"url":null,"abstract":"This compendium reports on single-event latchup and total ionizing dose results for a variety of operational amplifiers targeted for possible use in NASA spacecraft. It covers devices tested over the last 15 years.","PeriodicalId":223557,"journal":{"name":"2014 IEEE Radiation Effects Data Workshop (REDW)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial and Radiation Tolerant Operational Amplifiers\",\"authors\":\"F. Irom, S. Agarwal, Mehran Amrbar\",\"doi\":\"10.1109/REDW.2014.7004561\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This compendium reports on single-event latchup and total ionizing dose results for a variety of operational amplifiers targeted for possible use in NASA spacecraft. It covers devices tested over the last 15 years.\",\"PeriodicalId\":223557,\"journal\":{\"name\":\"2014 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-07-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/REDW.2014.7004561\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.2014.7004561","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial and Radiation Tolerant Operational Amplifiers
This compendium reports on single-event latchup and total ionizing dose results for a variety of operational amplifiers targeted for possible use in NASA spacecraft. It covers devices tested over the last 15 years.