K. Sano, A. Takahashi, Y. Yamanashi, N. Yoshikawa, N. Zen, K. Suzuki, M. Ohkubo
{"title":"飞行时间质谱单通量量子时间-数字转换器的设计和高速测试","authors":"K. Sano, A. Takahashi, Y. Yamanashi, N. Yoshikawa, N. Zen, K. Suzuki, M. Ohkubo","doi":"10.1109/ISEC.2013.6604259","DOIUrl":null,"url":null,"abstract":"We are developing a single-flux-quantum (SFQ) time-to-digital converter (TDC) for time-of-flight mass spectrometry (TOF MS) system. In this study, we designed and tested a 24-bit SFQ TDC with a 3 × 24-bit FIFO buffer using the AIST Nb standard process (STP2), whose time resolution and dynamic range are 100 ps and 1.6 ms, respectively. The TDC design was improved to reduce the total junction numbers and the bias current in order to install it in a 4.2 K cryo-cooler. We confirmed the operation of the TDC and evaluated the jitter by measuring a histogram of TDC read out.","PeriodicalId":233581,"journal":{"name":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-07-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Design and high-speed tests of a single-flux-quantum time-to-digital converter for time-of-flight mass spectrometry\",\"authors\":\"K. Sano, A. Takahashi, Y. Yamanashi, N. Yoshikawa, N. Zen, K. Suzuki, M. Ohkubo\",\"doi\":\"10.1109/ISEC.2013.6604259\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We are developing a single-flux-quantum (SFQ) time-to-digital converter (TDC) for time-of-flight mass spectrometry (TOF MS) system. In this study, we designed and tested a 24-bit SFQ TDC with a 3 × 24-bit FIFO buffer using the AIST Nb standard process (STP2), whose time resolution and dynamic range are 100 ps and 1.6 ms, respectively. The TDC design was improved to reduce the total junction numbers and the bias current in order to install it in a 4.2 K cryo-cooler. We confirmed the operation of the TDC and evaluated the jitter by measuring a histogram of TDC read out.\",\"PeriodicalId\":233581,\"journal\":{\"name\":\"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)\",\"volume\":\"28 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-07-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEC.2013.6604259\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 14th International Superconductive Electronics Conference (ISEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEC.2013.6604259","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design and high-speed tests of a single-flux-quantum time-to-digital converter for time-of-flight mass spectrometry
We are developing a single-flux-quantum (SFQ) time-to-digital converter (TDC) for time-of-flight mass spectrometry (TOF MS) system. In this study, we designed and tested a 24-bit SFQ TDC with a 3 × 24-bit FIFO buffer using the AIST Nb standard process (STP2), whose time resolution and dynamic range are 100 ps and 1.6 ms, respectively. The TDC design was improved to reduce the total junction numbers and the bias current in order to install it in a 4.2 K cryo-cooler. We confirmed the operation of the TDC and evaluated the jitter by measuring a histogram of TDC read out.
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