低噪声和高动态范围CMOS集成电子与双面硅带探测器康普顿相机伽玛射线探测系统相关

M. Dahoumane, D. Dauvergne, J. Krimmer, J.-L. Ley, E. Testa, Y. Zoccarato
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引用次数: 1

摘要

采用AMS-CMOS 0.35 μm工艺设计和制造了一个8通道前端集成电子(FEE)电路,用于装备康普顿相机系统,用于强光疗法的质量控制。该电路提供了在2毫米厚的双面硅带探测器(DSSD)中相互作用的提示γ射线沉积的能量,(x,y,z)空间坐标和相互作用的时间。每个通道包括一个电荷敏感放大器(CSA)和两个并联整形器。采用整形时间分别为1 μs和15 ns的慢速和快速整形器分别测量能量和时间戳。为了提高检测效率,采用3位多增益配置实现快速整形。后者的输出被送到电压比较器,电压比较器提供数字信号作为事件时间戳和CSA反馈电容的复位信号,以避免堆积或电路饱和。集成了一个5位DAC来补偿通道之间的任何比较器偏移色散。该设计还集成了可编程数字电路,用于调整复位信号的延迟和宽度。所有配置设置由集成在电路中的I2C接口电路控制。本设计通过空穴或电子可配置系统提供DSSD的双面读出。该设计的所有功能都已成功测试和验证。试验结果与分析和仿真计算结果吻合较好。在3×103至3×106电子范围内的高线性度达到3.6 mV/fC的转换增益。电路(CSA输出)实现等效噪声电荷(ENC) 290电子均方根。该电路的功耗为23mw /通道,占地面积为2×4.5 mm2,包括焊盘。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A low noise and high dynamic range CMOS integrated Electronics associated with double sided Silicon Strip Detectors for a Compton camera gamma-ray detecting system
An 8-channel Front End integrated Electronics (FEE) circuit is designed and fabricated using the AMS-CMOS 0.35 μm process to equip a Compton camera system for quality control in Hadrontherapy. The circuit provides the energy deposited by prompt γ rays interacting in a 2 mm thick Double sided Silicon Strip Detector (DSSD), the (x,y,z) space coordinates and the time of the interaction. Each channel includes a Charge Sensitive Amplifier (CSA) followed by two parallel shapers. Slow and fast shapers, with 1 μs and 15 ns shaping time are used to measure the energy and time stamping, respectively. In order to increase the detection efficiency, a 3 bit multi-gain configuration is chosen to implement the fast shaper. The output of the latter is sent to a voltage comparator which provides a digital signal used as event time stamp and resetting signal of the CSA feedback capacitor to avoid pileup or circuit saturation. A 5 bit DAC is integrated to compensate any comparator offset dispersion between channels. A programmable digital circuit is also integrated in this design to adjust the delay and the width of the reset signal. All configuration settings are controlled by an I2C interface circuit which is integrated in the circuit. The present design provides the readout of the two sides of the DSSD thanks to a hole or electron configurable system. All the functionalities of the design have been successfully tested and validated. The test results are in good agreement with analytical and simulation calculations. A high linearity over a range of 3×103 to 3×106 electrons is reached with a conversion gain of 3.6 mV/fC. The circuit (CSA output) achieves an ENC (Equivalent Noise Charge) of 290 electrons rms. The circuit dissipates 23 mW/channel and occupies an area of 2×4.5 mm2, including pads.
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