测定电流-电压特性测量用半导体器件瞬变持续时间的方法

2013 IEEE XXXIII International Scientific Conference Electronics and Nanotechnology (ELNANO) Pub Date : 2013-04-16 DOI:10.1109/ELNANO.2013.6552062

Ievgen O. Iermolenko, Oleksandr F. Bondarenko, K. Iermolenko

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引用次数: 2

摘要

提出了一种自动确定半导体器件振荡瞬态持续时间的改进方法，用于正确测量电流-电压特性。这种方法可以提高电流-电压特性测量的准确性。应用于电流-电压特性分析的测量装置中。

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The method of determining the duration of transients in semiconductor devices for current-voltage characteristics measurement

The improved method of automatic determining the duration of oscillating transients in semiconductor devices for correct current-voltage characteristics measurement is proposed. This method allows increasing the accuracy of current-voltage characteristics measurement. It is applied in measuring device for current-voltage characteristics analysis.

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来源期刊

2013 IEEE XXXIII International Scientific Conference Electronics and Nanotechnology (ELNANO)

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