基于传输门插入的时序误差弹性电路短路填充方法

Wentao Dai, Peiye Liu, Weiwei Shan
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引用次数: 2

摘要

基于时序误差检测和校正的弹性电路可以有效地缓解时序余量,但通常以额外的面积开销为代价。面积开销的主要来源之一是短路填充(保持时间固定),这比传统IC设计中的近阈值操作严重得多。因此,我们提出了一种使用传输门扩展短路径的插入方法,该方法比传统的弹性方法减少了面积开销。由于时钟控制传输门(CTG)作为透明低锁存器时可以将所有的短路径延长半个时钟,从而解决了短路径问题。此外,由于传输门同步了多个短路径,减少了组合逻辑的无效翻转,从而降低了故障功率。该技术应用于0.55V电源的28纳米CMOS制程SHA-256算法电路中,与传统的短路填充技术相比,减少了大量的面积开销。对于组合电路,其面积从153.34%减小到4.43%,对于顺序电路,其面积从124.33%减小到19.33%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Short-path Padding Method for Timing Error Resilient Circuits based on Transmission Gates Insertion
Resilient circuits based on timing error detection and correction can mitigate the timing margin effectively, but usually at a cost of extra area overhead. One of the major sources of area overhead is short-path padding (hold time fix), which is much severer than in traditional IC design for near-threshold operation. Therefore, we propose an insertion methodology by using transmission gates to extend short-paths, which decreases area overhead than traditional resilient methods. Because the clock-controlled transmission gate (CTG) can extend all the short paths by half a clock when working as a transparent-low latch, the short-paths problem is solved. Besides, as the transmission gates synchronize the multiple short paths, it decreases the invalid flipping of combinational logic, which reduces the glitch power. Applied on a SHA-256 algorithm circuit in a 28nm CMOS process with 0.55V supply, the proposed technique reduces the area overhead a lot compared to the conventional short-path padding techniques. For combinational circuit, its area reduces from 153.34% to 4.43%, and for sequential circuit area, it reduces from 124.33% to 19.33%.
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