{"title":"通信设备连续抗扰度试验条件研究","authors":"S. Kanno, F. Takemoto, S. Rikiishi, N. Kuwabara","doi":"10.1109/ISEMC.1994.385601","DOIUrl":null,"url":null,"abstract":"The relation between continuous wave immunity test conditions and failure results of equipment under test is discussed. The difference between the radiated immunity test and the conductive immunity test, and the use of the impress durations and sweep rates to detect failure are investigated. As a results, it is clarified that the results of the radiated immunity test are different from that of the conducted immunity test.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Investigation of continuous wave immunity test conditions for telecommunication equipment\",\"authors\":\"S. Kanno, F. Takemoto, S. Rikiishi, N. Kuwabara\",\"doi\":\"10.1109/ISEMC.1994.385601\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The relation between continuous wave immunity test conditions and failure results of equipment under test is discussed. The difference between the radiated immunity test and the conductive immunity test, and the use of the impress durations and sweep rates to detect failure are investigated. As a results, it is clarified that the results of the radiated immunity test are different from that of the conducted immunity test.<<ETX>>\",\"PeriodicalId\":154914,\"journal\":{\"name\":\"Proceedings of IEEE Symposium on Electromagnetic Compatibility\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-08-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1994.385601\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1994.385601","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation of continuous wave immunity test conditions for telecommunication equipment
The relation between continuous wave immunity test conditions and failure results of equipment under test is discussed. The difference between the radiated immunity test and the conductive immunity test, and the use of the impress durations and sweep rates to detect failure are investigated. As a results, it is clarified that the results of the radiated immunity test are different from that of the conducted immunity test.<>
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