一种基于微带的屏蔽效能测试系统

The 2012 International Workshop on Microwave and Millimeter Wave Circuits and System Technology Pub Date : 2012-04-19 DOI:10.1109/MMWCST.2012.6238200

Minhui Zeng, E. Li, Gaofeng Guo

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引用次数: 3

摘要

随着电子产品的广泛应用，电磁辐射的危害越来越受到人们的重视。因此，电磁屏蔽材料被广泛用于抑制电磁辐射。本文综述了材料屏蔽效能的测试方法。提出了一种基于微带的屏蔽效能测试系统。该测试系统给出了两种特殊屏蔽材料在10mhz - 3ghz频段的S21参数测量结果。结果表明，该测试系统可用于估算某些平面材料的屏蔽效能。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A microstrip-based test system for shielding effectiveness measurement

With the widespread application of electronic products, the hazards of electromagnetic radiation has been drawn much attention. Thus, electromagnetic shielding materials are widely used to suppress electromagnetic radiation. In this paper, test methods of shielding effectiveness of materials ware reviewed. A microstrip-based test system for shielding effectiveness measurement was proposed. Measurement results of S21 parameter for two special shielding materials in the 10 MHz-3 GHz ware derived by this test system. It is shown that this test system can be used to estimate shielding effectiveness (SE) of some plane materials.

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The 2012 International Workshop on Microwave and Millimeter Wave Circuits and System Technology

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