基于软件的处理器串扰故障自检方法

Xiaoliang Bai, Li Chen, S. Dey
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引用次数: 7

摘要

由于信号完整性问题对时序、电源电压和温度的固有敏感性,需要在运行速度和电路的自然运行环境中测试交流故障,如串扰引起的错误。为了克服高速外部测试的令人生畏的成本和不断增加的性能障碍,基于软件的。自检(SBST)是一种高质量的检测方法。可编程处理器和片上系统(SoC)交流故障的低成本高速测试解决方案。SBST利用低成本的测试器,在自然的操作环境中应用测试并捕获测试响应。因此,SBST避免了人为的测试环境和外部测试引起的不准确性。与卡滞故障测试不同,串扰故障测试需要以运行速度传递一系列测试向量。SBST使用指令在功能模式下应用测试。不同的指令对被测模块(MUT)施加不同的可控性和可观察性约束。搜索合适的指令和操作数序列的复杂性变得高得令人望而却步。本文提出了一种新的方法,将结构测试生成技术与指令级约束有效地结合起来,以克服复杂性的挑战。在多个时间框架内的MUT被超级虚拟约束电路(supervcc)自动平展和增强,从而指导自动测试模式生成(ATPG)工具进行选择。适当的测试说明和操作数。提出的方法能够自动生成测试程序和高保真测试解决方案:为交流故障。实验结果显示在商用嵌入式处理器(Xtensa/sup /spl trade//来自Tensilica Inc)上。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Software-based self-test methodology for crosstalk faults in processors
Due to signal integrity problems inherent sensitivity to timing, power supply voltage and temperature, it is desirable to test AC failures such as crosstalk-induced errors at operational speed and in the circuit's natural operational environment. To overcome the daunting cost and increasing performance hindrance of high-speed external testers, Software-Based. Self-Test (SBST) is proposed as a high-quality. low-cost at-speed testing solution for AC failures in programmable processors and System-on-Chips (SoC). SBST utilizes low-cost testers, applies tests and captures test responses in the natural operational environment. Hence SBST avoids artificial testing environment and external tester induced inaccuracies. Different from testing for stuck-at faults, testing for crosstalk faults requires a sequence of test vectors delivered at the operational speed. SBST applies tests in functional mode using instructions. Different instructions impose different controllability and observability constraints on a module-under-test (MUT). The complexity of searching for an appropriate sequence of instructions and operands becomes prohibitively high. In this paper, we propose a novel methodology to conquer the complexity challenge by efficiently combining structural test generation technique with instruction-level constraints. MUT in several time frames is automatically flattened and augmented with Super Virtual Constraint Circuits (SuperVCCs), which guide an automatic test pattern generation (ATPG) tool to select. appropriate test instructions and operands. The proposed methodology enables automatic test-program generation and high-fidelity test solution:for AC failures. Experimental results are shown on a commercial embedded processor (Xtensa/sup /spl trade// from Tensilica Inc).
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