电流偏置下超导微桥的电压稳定性

A. Leo, A. Nigro, G. Carapella, S. Pace, P. Romano, G. Grimaldi, P. Daponte
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引用次数: 1

摘要

在超导薄膜中,耗散磁流态对在偏置电流下工作的器件(如超导电子学和超导单粒子/光子探测器)的稳定性起着至关重要的作用。因此,我们采用合适的电流-电压测量模式来研究超导薄膜中电压稳定性对电流输运的影响,研究离子辐照对相关电流参数的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Voltage stability under current bias in superconducting microbridges
In superconducting films, the dissipative flux flow state plays a crucial role in the stability of those devices that operate under bias current whose value is very close to the critical current value, such as superconducting electronics and superconducting single particle/photon detectors. Therefore, we study the voltage stability versus electrical current transport by proper current-voltage measurement modes in superconducting films, investigating the effects of ion irradiation on the relevant current parameters.
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