FPGA快速成型自动调试电路

Zdravko Panjkov, A. Wasserbauer, T. Ostermann, R. Hagelauer
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引用次数: 2

摘要

在现代验证环境下,基于fpga的原型设计已经成为整个验证流程的重要组成部分。以更真实的速度模拟实时应用程序的能力允许比传统HDL逻辑模拟器更高的覆盖范围。FPGA原型设计的主要缺点是无法检测和观察FPGA内部信号。目前这个问题的唯一商业解决方案是使用嵌入式跟踪缓冲器来记录内部信号的子集。这要求首先检测到问题,然后设计人员可以实现额外的跟踪缓冲区并进行新的合成。本文提出了一种自动调试电路,可以方便地获取和提取所有内部信号。调试电路建立在剩余的FPGA资源上,因此重要的是这不会对FPGA性能产生负面影响。实验表明,自动调试电路不会显著降低FPGA的性能,可用于FPGA的快速原型设计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Automatic debug circuit for FPGA rapid prototyping
In the modern verification environment the FPGA-based prototyping has become an important part of the whole verification flow. The ability to simulate real time application in the more realistic speeds allows much higher coverage than traditional HDL logic simulators. The main disadvantage of FPGA prototyping is inability to inspect and observe internal FPGA signals. Currently the only commercial solution for this problem is using embedded trace-buffers to record subsets of internal signals. This requires that the problem is first detected and then designer can implement additional trace-buffers and make new synthesis. This paper, presents an automatic debug circuit which allows easy access and extraction of all internal signals. The debug circuit is built on a remaining FPGA resources so it's important that this does not have a negative effect on the FPGA performance. The experiments showed that the automatic debug circuit does not significantly reduces FPGA performance and that it can be used for FPGA rapid prototyping.
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