用于全自检电路的强码分离CMOS内置中压传感器的设计与实现

Joseph C. W. Pang, M. Wong, Yim-Shu Lee
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引用次数: 1

摘要

提出了一种实现CMOS内置中压传感器(BIVS)的新方法。BIVS的功能是用来检测电路中任何由桥接和晶体管卡死故障引起的中间电压。对所提电路的详细分析表明,总体设计不仅可以检测到被测电路中的故障,而且可以检测到或容忍自身的故障。给出了采用BIVS作为输出检测元件提高全自检电路有效性的应用实例。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design and implementation of strongly code disjoint CMOS built-in intermediate voltage sensor for totally self-checking circuits
This paper presents a new approach to implement a strongly code-disjoint CMOS built-in intermediate voltage sensor(BIVS). The function of the BIVS is used to detect any intermediate voltage caused by bridging and transistor stuck-on faults in the circuit. Detailed analyses of the proposed circuit have shown that the overall design not only can detect fault in the circuit under test, but also can detect or tolerate the fault in itself. An application example employing the BIVS as the output detection element to enhance the effectiveness of the totally selfchecking circuit is given.
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