{"title":"微管道故障建模与测试问题","authors":"S. Pagey, S. Sherlekar, G. Venkatesh","doi":"10.1109/ATS.1992.224446","DOIUrl":null,"url":null,"abstract":"Micropipelines, suggested by Ivan Sutherland (1989) form an elegant scheme for asynchronous implementation of pipelined circuits. The authors analyse the faulty behavior of micropipelines and propose schemes for testing. They suggest that the control part of the micropipeline is concurrently testable during normal operation and that test pattern generation for the data part logic can be reduced to that for combinational circuits, with a simple modification only in the test application method. Testing latches require a two-pattern test which can be generated using test pattern generation techniques for combinational circuits.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"10 8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"25","resultStr":"{\"title\":\"Issues in fault modelling and testing of micropipelines\",\"authors\":\"S. Pagey, S. Sherlekar, G. Venkatesh\",\"doi\":\"10.1109/ATS.1992.224446\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Micropipelines, suggested by Ivan Sutherland (1989) form an elegant scheme for asynchronous implementation of pipelined circuits. The authors analyse the faulty behavior of micropipelines and propose schemes for testing. They suggest that the control part of the micropipeline is concurrently testable during normal operation and that test pattern generation for the data part logic can be reduced to that for combinational circuits, with a simple modification only in the test application method. Testing latches require a two-pattern test which can be generated using test pattern generation techniques for combinational circuits.<<ETX>>\",\"PeriodicalId\":208029,\"journal\":{\"name\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"volume\":\"10 8 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"25\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings First Asian Test Symposium (ATS `92)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.1992.224446\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings First Asian Test Symposium (ATS `92)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1992.224446","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 25
摘要
Ivan Sutherland(1989)提出的微管道形成了异步实现流水线电路的优雅方案。对微管道的故障行为进行了分析,并提出了检测方案。他们认为,微管道的控制部分在正常运行时可以同时进行测试,数据部分逻辑的测试模式生成可以简化为组合电路的测试模式生成,只需在测试应用方法中进行简单的修改。测试锁存器需要双模式测试,可以使用组合电路的测试模式生成技术生成。
Issues in fault modelling and testing of micropipelines
Micropipelines, suggested by Ivan Sutherland (1989) form an elegant scheme for asynchronous implementation of pipelined circuits. The authors analyse the faulty behavior of micropipelines and propose schemes for testing. They suggest that the control part of the micropipeline is concurrently testable during normal operation and that test pattern generation for the data part logic can be reduced to that for combinational circuits, with a simple modification only in the test application method. Testing latches require a two-pattern test which can be generated using test pattern generation techniques for combinational circuits.<>