{"title":"VLSI/FLC空间光调制器的焊接研究","authors":"Wei Lin, Y. Lee, K. Johnson","doi":"10.1109/ECTC.1993.346800","DOIUrl":null,"url":null,"abstract":"Spatial light modulators (SLM) using ferroelectric liquid crystal over a very large scale integrated circuit (VLSI/FLC) are critical elements to high-definition displays, pattern correlation, and many other optoelectronic processing systems. A self-aligning soldering technology is being developed to package these high-performance modulators cost-effectively. It needs to achieve a uniform, /spl mu/m-level gap for FLC, and align the glass, the VLSI, and the substrate with an accuracy of 10 /spl mu/m. Two studies have been conducted to assist the technology development. The first designs the solder joints for the assembly. By modeling, 0.4 mm/sup 3/ is chosen for the volume of the large solder joints (1000 /spl mu/m in diameter) that would produce the maximum force pulling the glass against the VLSI for the gap control. Also, 11.4/spl times/10/sup 6/ /spl mu/m/sup 3/ is chosen for the volume of the medium solder joints (500 /spl mu/m in diameter) under the VLSI for low-cost self-alignments. The second study develops a fluxless soldering process with the measurements of the surface tension coefficients w.r.t. different reflow parameters. The optimum parameters are 280/spl deg/C of the hot paddle and 2.5 liter/min flow rate of the forming gas. The achieved surface tension coefficient is abound 280 dyne/cm that assures the quality of the developed soldering is as good as that of the soldering using flux. A glass/silicon test vehicle is soldered with the optimum parameters. The range of its gap thicknesses measured over the entire area is from 1.7 to 2.6 /spl mu/m. The developed soldering technology achieves the required /spl mu/m-level gap with sub-/spl mu/m uniformity.<<ETX>>","PeriodicalId":281423,"journal":{"name":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Study of soldering for VLSI/FLC spatial light modulators\",\"authors\":\"Wei Lin, Y. Lee, K. Johnson\",\"doi\":\"10.1109/ECTC.1993.346800\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Spatial light modulators (SLM) using ferroelectric liquid crystal over a very large scale integrated circuit (VLSI/FLC) are critical elements to high-definition displays, pattern correlation, and many other optoelectronic processing systems. A self-aligning soldering technology is being developed to package these high-performance modulators cost-effectively. It needs to achieve a uniform, /spl mu/m-level gap for FLC, and align the glass, the VLSI, and the substrate with an accuracy of 10 /spl mu/m. Two studies have been conducted to assist the technology development. The first designs the solder joints for the assembly. By modeling, 0.4 mm/sup 3/ is chosen for the volume of the large solder joints (1000 /spl mu/m in diameter) that would produce the maximum force pulling the glass against the VLSI for the gap control. Also, 11.4/spl times/10/sup 6/ /spl mu/m/sup 3/ is chosen for the volume of the medium solder joints (500 /spl mu/m in diameter) under the VLSI for low-cost self-alignments. The second study develops a fluxless soldering process with the measurements of the surface tension coefficients w.r.t. different reflow parameters. The optimum parameters are 280/spl deg/C of the hot paddle and 2.5 liter/min flow rate of the forming gas. The achieved surface tension coefficient is abound 280 dyne/cm that assures the quality of the developed soldering is as good as that of the soldering using flux. A glass/silicon test vehicle is soldered with the optimum parameters. The range of its gap thicknesses measured over the entire area is from 1.7 to 2.6 /spl mu/m. The developed soldering technology achieves the required /spl mu/m-level gap with sub-/spl mu/m uniformity.<<ETX>>\",\"PeriodicalId\":281423,\"journal\":{\"name\":\"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.1993.346800\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1993.346800","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Study of soldering for VLSI/FLC spatial light modulators
Spatial light modulators (SLM) using ferroelectric liquid crystal over a very large scale integrated circuit (VLSI/FLC) are critical elements to high-definition displays, pattern correlation, and many other optoelectronic processing systems. A self-aligning soldering technology is being developed to package these high-performance modulators cost-effectively. It needs to achieve a uniform, /spl mu/m-level gap for FLC, and align the glass, the VLSI, and the substrate with an accuracy of 10 /spl mu/m. Two studies have been conducted to assist the technology development. The first designs the solder joints for the assembly. By modeling, 0.4 mm/sup 3/ is chosen for the volume of the large solder joints (1000 /spl mu/m in diameter) that would produce the maximum force pulling the glass against the VLSI for the gap control. Also, 11.4/spl times/10/sup 6/ /spl mu/m/sup 3/ is chosen for the volume of the medium solder joints (500 /spl mu/m in diameter) under the VLSI for low-cost self-alignments. The second study develops a fluxless soldering process with the measurements of the surface tension coefficients w.r.t. different reflow parameters. The optimum parameters are 280/spl deg/C of the hot paddle and 2.5 liter/min flow rate of the forming gas. The achieved surface tension coefficient is abound 280 dyne/cm that assures the quality of the developed soldering is as good as that of the soldering using flux. A glass/silicon test vehicle is soldered with the optimum parameters. The range of its gap thicknesses measured over the entire area is from 1.7 to 2.6 /spl mu/m. The developed soldering technology achieves the required /spl mu/m-level gap with sub-/spl mu/m uniformity.<>