VLSI/FLC空间光调制器的焊接研究

Wei Lin, Y. Lee, K. Johnson
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引用次数: 12

摘要

在超大规模集成电路(VLSI/FLC)上使用铁电液晶的空间光调制器(SLM)是高清显示、模式相关和许多其他光电处理系统的关键元件。目前正在开发一种自对准焊接技术,以经济有效地封装这些高性能调制器。它需要为FLC实现均匀的/spl mu/m级间隙,并以10 /spl mu/m的精度对齐玻璃,VLSI和基板。已经进行了两项研究以协助技术发展。第一个设计装配的焊点。通过建模,对于大型焊点(直径1000 /spl mu/m)的体积选择0.4 mm/sup 3/,这将产生最大的力将玻璃拉到VLSI上以控制间隙。此外,对于VLSI下的中等焊点(直径500 /spl mu/m)的体积(直径500 /spl mu/m),选择11.4/spl times/10/sup 6/ /spl mu/m/sup 3/,以实现低成本的自校准。第二项研究开发了一种无焊剂焊接工艺,测量了不同回流参数下的表面张力系数。最佳参数为热桨温度280℃/spl℃,成形气体流速2.5 l /min。所获得的表面张力系数可达280达因/cm以上,保证了所研制的焊锡质量与使用助焊剂的焊锡质量相当。采用最佳工艺参数对玻璃/硅测试车进行了焊接。在整个区域测量的间隙厚度范围为1.7 - 2.6 /spl mu/m。所开发的焊接技术实现了所需的/spl μ m级间隙和亚/spl μ m级均匀性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Study of soldering for VLSI/FLC spatial light modulators
Spatial light modulators (SLM) using ferroelectric liquid crystal over a very large scale integrated circuit (VLSI/FLC) are critical elements to high-definition displays, pattern correlation, and many other optoelectronic processing systems. A self-aligning soldering technology is being developed to package these high-performance modulators cost-effectively. It needs to achieve a uniform, /spl mu/m-level gap for FLC, and align the glass, the VLSI, and the substrate with an accuracy of 10 /spl mu/m. Two studies have been conducted to assist the technology development. The first designs the solder joints for the assembly. By modeling, 0.4 mm/sup 3/ is chosen for the volume of the large solder joints (1000 /spl mu/m in diameter) that would produce the maximum force pulling the glass against the VLSI for the gap control. Also, 11.4/spl times/10/sup 6/ /spl mu/m/sup 3/ is chosen for the volume of the medium solder joints (500 /spl mu/m in diameter) under the VLSI for low-cost self-alignments. The second study develops a fluxless soldering process with the measurements of the surface tension coefficients w.r.t. different reflow parameters. The optimum parameters are 280/spl deg/C of the hot paddle and 2.5 liter/min flow rate of the forming gas. The achieved surface tension coefficient is abound 280 dyne/cm that assures the quality of the developed soldering is as good as that of the soldering using flux. A glass/silicon test vehicle is soldered with the optimum parameters. The range of its gap thicknesses measured over the entire area is from 1.7 to 2.6 /spl mu/m. The developed soldering technology achieves the required /spl mu/m-level gap with sub-/spl mu/m uniformity.<>
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