S. Long, J. Kinoshita, R. D. Fairman, R. Hamilton, I. Ku, F. B. Fank
{"title":"高可靠的连续波和脉冲砷化镓读出二极管","authors":"S. Long, J. Kinoshita, R. D. Fairman, R. Hamilton, I. Ku, F. B. Fank","doi":"10.1109/EUMA.1976.332239","DOIUrl":null,"url":null,"abstract":"The development of GaAs Read Impatt diodes has resulted in the availability of reliable, long life, highly efficient CW and pulsed medium power devices. The use of a hi-lo Read structure with a grown GaAs p-n junction provides for the long life and highly efficient medium power devices. CW efficiencies in excess of 15% are routinely available at power levels of 2-3 watts. Pulse power outputs above 15 watts and with efficiencies of 20% are standard. For the pulsed devices, the results were obtained with a duty cycle of 25%. With these performances, lifetimes can be predicted to be in the 107 hour range for junction temperatures of 200°.","PeriodicalId":377507,"journal":{"name":"1976 6th European Microwave Conference","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1976-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Highly Reliable CW and Pulsed GaAs Read Diodes\",\"authors\":\"S. Long, J. Kinoshita, R. D. Fairman, R. Hamilton, I. Ku, F. B. Fank\",\"doi\":\"10.1109/EUMA.1976.332239\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The development of GaAs Read Impatt diodes has resulted in the availability of reliable, long life, highly efficient CW and pulsed medium power devices. The use of a hi-lo Read structure with a grown GaAs p-n junction provides for the long life and highly efficient medium power devices. CW efficiencies in excess of 15% are routinely available at power levels of 2-3 watts. Pulse power outputs above 15 watts and with efficiencies of 20% are standard. For the pulsed devices, the results were obtained with a duty cycle of 25%. With these performances, lifetimes can be predicted to be in the 107 hour range for junction temperatures of 200°.\",\"PeriodicalId\":377507,\"journal\":{\"name\":\"1976 6th European Microwave Conference\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1976-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1976 6th European Microwave Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUMA.1976.332239\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1976 6th European Microwave Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMA.1976.332239","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The development of GaAs Read Impatt diodes has resulted in the availability of reliable, long life, highly efficient CW and pulsed medium power devices. The use of a hi-lo Read structure with a grown GaAs p-n junction provides for the long life and highly efficient medium power devices. CW efficiencies in excess of 15% are routinely available at power levels of 2-3 watts. Pulse power outputs above 15 watts and with efficiencies of 20% are standard. For the pulsed devices, the results were obtained with a duty cycle of 25%. With these performances, lifetimes can be predicted to be in the 107 hour range for junction temperatures of 200°.