csp24陶瓷封装热阻评估

Xiao Peng, Shuidi Wang, Songliang Jia, Jian Cai, Qiang Huang, Rongzhen Ding
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引用次数: 2

摘要

基于MIL STD 883方法1012和SEMI标准G30-88和G32-86。采用纯电法测量csp24封装的热阻。首先在温控液槽中对温度敏感参数(TSP)进行了测量和校准。然后根据实验选择合适的测试条件,包括测量电流(IM)和测试功率PHmiddot。在两种情况下进行了热阻测量:一种是散热器采用大散热器,使壳体温度保持在60℃。温控液槽。此外,采用两种不同尺寸的热测试芯片(1.91times1.91mm和3.92times3.92mm)来测试芯片尺寸的影响。给出了实验结果。利用Fluent软件对csp24封装的热阻进行了仿真。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Evaluation of the Thermal Resistance of CSOP24 Ceramic Package
On the basis of MIL STD 883 method 1012 and SEMI standard G30-88 and G32-86. purely electrical approaches were implemented to measure the thermal resistance of CSOP24 package. Firstly the temperature sensitive parameter (TSP) was measured and calibrated in a temperature controlled fluid trough. Then proper test conditions including measurement current (IM) and test power PHmiddot were chosen according to experiments. Thermal resistance measurements were carried out in the two conditions: radiator with big heat sink which keeps the case temperature Tc at 60 degC. and temperature controlled fluid trough. In addition, two kinds of thermal test chips with different size (1.91times1.91mm and 3.92times3.92mm) were used to test the influence of the chip size. Experimental result was provided. Moreover, the thermal resistance of the CSOP24 package was simulated by utilizing Fluent software.
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