{"title":"近场扫描微波显微镜用于地下无损表征","authors":"Sijia Gu, K. Haddadi, A. El Fellahi, T. Lasri","doi":"10.1109/EUMC.2015.7345723","DOIUrl":null,"url":null,"abstract":"We report a nondestructive testing system based on near-field scanning microwave microscopy. The instrumentation is built up with a vector network analyzer, a fully automated tuning matching network and an evanescent microwave probe. The system can perform microwave images in the frequency band 0.1-20 GHz on scanning ranges of 25×25 cm2. The spatial resolution is experimentally verified by investigating imaging of metal slots. A lumped element model is built to describe the probe-sample interaction.","PeriodicalId":350086,"journal":{"name":"2015 European Microwave Conference (EuMC)","volume":"9 6","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Near-field scanning microwave microscope for subsurface non-destructive characterization\",\"authors\":\"Sijia Gu, K. Haddadi, A. El Fellahi, T. Lasri\",\"doi\":\"10.1109/EUMC.2015.7345723\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report a nondestructive testing system based on near-field scanning microwave microscopy. The instrumentation is built up with a vector network analyzer, a fully automated tuning matching network and an evanescent microwave probe. The system can perform microwave images in the frequency band 0.1-20 GHz on scanning ranges of 25×25 cm2. The spatial resolution is experimentally verified by investigating imaging of metal slots. A lumped element model is built to describe the probe-sample interaction.\",\"PeriodicalId\":350086,\"journal\":{\"name\":\"2015 European Microwave Conference (EuMC)\",\"volume\":\"9 6\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-12-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 European Microwave Conference (EuMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EUMC.2015.7345723\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 European Microwave Conference (EuMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUMC.2015.7345723","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Near-field scanning microwave microscope for subsurface non-destructive characterization
We report a nondestructive testing system based on near-field scanning microwave microscopy. The instrumentation is built up with a vector network analyzer, a fully automated tuning matching network and an evanescent microwave probe. The system can perform microwave images in the frequency band 0.1-20 GHz on scanning ranges of 25×25 cm2. The spatial resolution is experimentally verified by investigating imaging of metal slots. A lumped element model is built to describe the probe-sample interaction.
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