{"title":"LDPC码中捕获集的识别技术","authors":"Christos Vasilopoulos, Vassilis Paliouras","doi":"10.1109/ICECS.2014.7050116","DOIUrl":null,"url":null,"abstract":"In this paper we consider the problem of identifying trapping sets in Low Density Parity Check codes (LDPC), which is a hard NP-complete problem, as conjectured in [1]. We introduce a method for identifying trapping sets in LDPC codes. The proposed method is flexible and parametric. Furthermore it achieves low complexity and execution time and low memory requirements.","PeriodicalId":133747,"journal":{"name":"2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)","volume":"148 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A technique for the identification of trapping sets in LDPC codes\",\"authors\":\"Christos Vasilopoulos, Vassilis Paliouras\",\"doi\":\"10.1109/ICECS.2014.7050116\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we consider the problem of identifying trapping sets in Low Density Parity Check codes (LDPC), which is a hard NP-complete problem, as conjectured in [1]. We introduce a method for identifying trapping sets in LDPC codes. The proposed method is flexible and parametric. Furthermore it achieves low complexity and execution time and low memory requirements.\",\"PeriodicalId\":133747,\"journal\":{\"name\":\"2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)\",\"volume\":\"148 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICECS.2014.7050116\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECS.2014.7050116","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A technique for the identification of trapping sets in LDPC codes
In this paper we consider the problem of identifying trapping sets in Low Density Parity Check codes (LDPC), which is a hard NP-complete problem, as conjectured in [1]. We introduce a method for identifying trapping sets in LDPC codes. The proposed method is flexible and parametric. Furthermore it achieves low complexity and execution time and low memory requirements.