D. Webster, J. Cavazos, D. Guy, P. Patchen, D. Lie
{"title":"使用内置自检对WLAN系统进行结构验证","authors":"D. Webster, J. Cavazos, D. Guy, P. Patchen, D. Lie","doi":"10.1109/DCAS.2010.5955035","DOIUrl":null,"url":null,"abstract":"This paper describes Built-in Self Test (BiST) techniques used to verify the integrity of a RF CMOS WLAN transceiver by Texas Instruments. The set of BiSTs covers the primary blocks in the RF/analog portion of the radio, verifying the system to be free of defects in a high volume production setting with minimal tester resources. This approach promotes a highly parallel testing opportunity, resulting in reduced test time with lower cost.","PeriodicalId":405694,"journal":{"name":"2010 IEEE Dallas Circuits and Systems Workshop","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Structural verification of a WLAN system using Built-in Self Tests\",\"authors\":\"D. Webster, J. Cavazos, D. Guy, P. Patchen, D. Lie\",\"doi\":\"10.1109/DCAS.2010.5955035\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes Built-in Self Test (BiST) techniques used to verify the integrity of a RF CMOS WLAN transceiver by Texas Instruments. The set of BiSTs covers the primary blocks in the RF/analog portion of the radio, verifying the system to be free of defects in a high volume production setting with minimal tester resources. This approach promotes a highly parallel testing opportunity, resulting in reduced test time with lower cost.\",\"PeriodicalId\":405694,\"journal\":{\"name\":\"2010 IEEE Dallas Circuits and Systems Workshop\",\"volume\":\"36 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE Dallas Circuits and Systems Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DCAS.2010.5955035\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE Dallas Circuits and Systems Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DCAS.2010.5955035","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Structural verification of a WLAN system using Built-in Self Tests
This paper describes Built-in Self Test (BiST) techniques used to verify the integrity of a RF CMOS WLAN transceiver by Texas Instruments. The set of BiSTs covers the primary blocks in the RF/analog portion of the radio, verifying the system to be free of defects in a high volume production setting with minimal tester resources. This approach promotes a highly parallel testing opportunity, resulting in reduced test time with lower cost.