{"title":"硬件保障:特洛伊木马、伪造和互联世界中的安全","authors":"M. Casto","doi":"10.1145/3194554.3194555","DOIUrl":null,"url":null,"abstract":"Dr. Matthew Casto is Chief of the Air Force Research Laboratory, Sensor’s Directorate, Trusted Electronics Branch. He is the Air Force’s Hardware Assurance technical lead for the Department of Defense (DoD) Joint Federated Assurance Center, and the Science and Technology technical execution lead for the DoD Trusted and Assured Microelectronics Initiative. Dr. Casto is a Senior Electronics Engineer with a BSEE and MSEE degree from Wright State University, and a PhD from The Ohio State University Electro-science Laboratory. Matt is a member of the IEEE and has authored numerous publications and patents in the areas of nonlinear and electro-thermal device modeling, advanced mixedsignal integrated circuit, system on a chip, design and characterization, and the design and analysis of secure, trustworthy microelectronics.","PeriodicalId":215940,"journal":{"name":"Proceedings of the 2018 on Great Lakes Symposium on VLSI","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Hardware Assurance: Trojans, Counterfeits, and Security in an Interconnected World\",\"authors\":\"M. Casto\",\"doi\":\"10.1145/3194554.3194555\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Dr. Matthew Casto is Chief of the Air Force Research Laboratory, Sensor’s Directorate, Trusted Electronics Branch. He is the Air Force’s Hardware Assurance technical lead for the Department of Defense (DoD) Joint Federated Assurance Center, and the Science and Technology technical execution lead for the DoD Trusted and Assured Microelectronics Initiative. Dr. Casto is a Senior Electronics Engineer with a BSEE and MSEE degree from Wright State University, and a PhD from The Ohio State University Electro-science Laboratory. Matt is a member of the IEEE and has authored numerous publications and patents in the areas of nonlinear and electro-thermal device modeling, advanced mixedsignal integrated circuit, system on a chip, design and characterization, and the design and analysis of secure, trustworthy microelectronics.\",\"PeriodicalId\":215940,\"journal\":{\"name\":\"Proceedings of the 2018 on Great Lakes Symposium on VLSI\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-05-30\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2018 on Great Lakes Symposium on VLSI\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/3194554.3194555\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2018 on Great Lakes Symposium on VLSI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3194554.3194555","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
摘要
Matthew Casto博士是美国空军研究实验室、传感器理事会、可信电子部门的负责人。他是美国空军国防部(DoD)联合联邦保证中心的硬件保证技术负责人，以及国防部可信和保证微电子计划的科技技术执行负责人。Casto博士是一名高级电子工程师，拥有Wright State University的BSEE和MSEE学位，以及俄亥俄州立大学电子科学实验室的博士学位。Matt是IEEE的成员，在非线性和电热器件建模、先进混合信号集成电路、片上系统、设计和表征以及安全、可靠微电子的设计和分析等领域撰写了许多出版物和专利。
Hardware Assurance: Trojans, Counterfeits, and Security in an Interconnected World
Dr. Matthew Casto is Chief of the Air Force Research Laboratory, Sensor’s Directorate, Trusted Electronics Branch. He is the Air Force’s Hardware Assurance technical lead for the Department of Defense (DoD) Joint Federated Assurance Center, and the Science and Technology technical execution lead for the DoD Trusted and Assured Microelectronics Initiative. Dr. Casto is a Senior Electronics Engineer with a BSEE and MSEE degree from Wright State University, and a PhD from The Ohio State University Electro-science Laboratory. Matt is a member of the IEEE and has authored numerous publications and patents in the areas of nonlinear and electro-thermal device modeling, advanced mixedsignal integrated circuit, system on a chip, design and characterization, and the design and analysis of secure, trustworthy microelectronics.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
