{"title":"基于支持向量机的纸张缺陷识别研究","authors":"Qiu Shubo, Gu Shuai, Zhang Tongxing","doi":"10.1109/ICIE.2010.49","DOIUrl":null,"url":null,"abstract":"Support Vector Machine (SVM) is a very popular arithmetic, based on SVM, developed a paper defects recognition system. In the stage of paper defects image segmentation, proposed a algorithm based on the SVM, While in the stage of paper defects feature extraction, applied a multi-class SVM to classify the paper defects. Experimental results show that the proposed system yields faster recognition speed and the average recognition rate of 97%,which performance is significantly better than BP neural network algorithm.","PeriodicalId":353239,"journal":{"name":"2010 WASE International Conference on Information Engineering","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-08-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Research on Paper Defects Recognition Based on SVM\",\"authors\":\"Qiu Shubo, Gu Shuai, Zhang Tongxing\",\"doi\":\"10.1109/ICIE.2010.49\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Support Vector Machine (SVM) is a very popular arithmetic, based on SVM, developed a paper defects recognition system. In the stage of paper defects image segmentation, proposed a algorithm based on the SVM, While in the stage of paper defects feature extraction, applied a multi-class SVM to classify the paper defects. Experimental results show that the proposed system yields faster recognition speed and the average recognition rate of 97%,which performance is significantly better than BP neural network algorithm.\",\"PeriodicalId\":353239,\"journal\":{\"name\":\"2010 WASE International Conference on Information Engineering\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-08-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 WASE International Conference on Information Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIE.2010.49\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 WASE International Conference on Information Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIE.2010.49","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Research on Paper Defects Recognition Based on SVM
Support Vector Machine (SVM) is a very popular arithmetic, based on SVM, developed a paper defects recognition system. In the stage of paper defects image segmentation, proposed a algorithm based on the SVM, While in the stage of paper defects feature extraction, applied a multi-class SVM to classify the paper defects. Experimental results show that the proposed system yields faster recognition speed and the average recognition rate of 97%,which performance is significantly better than BP neural network algorithm.