可修嵌入式ram的故障定位算法

Records of the 1993 IEEE International Workshop on Memory Testing Pub Date : 1993-08-09 DOI:10.1109/MT.1993.263149

R. Treuer, V. Agarwal

{"title":"可修嵌入式ram的故障定位算法","authors":"R. Treuer, V. Agarwal","doi":"10.1109/MT.1993.263149","DOIUrl":null,"url":null,"abstract":"The authors' research has led to: (1) the development of original rules for the conversion of single-bit march tests into multi-bit march tests; (2) the transformation of the new multi-bit march tests, using a 'serial shifting notation' which represents 'serial access' in embedded RAMs, into serial-access word-oriented march tests; and (3) the introduction of a new compact notation which extends the well-established march notation to include algorithms with two levels of FOR-loops (namely: the Galloping FOR-loop and the Hamming FOR-loop), since such algorithms are indispensible for locating coupling faults in cell arrays, and stuck-open faults in address decoders. Finally, a tabular summary (using both the 'hybrid serial/parallel' and the 'modular' data accessing modes) of fault location algorithms is given.<<ETX>>","PeriodicalId":248811,"journal":{"name":"Records of the 1993 IEEE International Workshop on Memory Testing","volume":"138 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Fault location algorithms for repairable embedded RAMs\",\"authors\":\"R. Treuer, V. Agarwal\",\"doi\":\"10.1109/MT.1993.263149\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors' research has led to: (1) the development of original rules for the conversion of single-bit march tests into multi-bit march tests; (2) the transformation of the new multi-bit march tests, using a 'serial shifting notation' which represents 'serial access' in embedded RAMs, into serial-access word-oriented march tests; and (3) the introduction of a new compact notation which extends the well-established march notation to include algorithms with two levels of FOR-loops (namely: the Galloping FOR-loop and the Hamming FOR-loop), since such algorithms are indispensible for locating coupling faults in cell arrays, and stuck-open faults in address decoders. Finally, a tabular summary (using both the 'hybrid serial/parallel' and the 'modular' data accessing modes) of fault location algorithms is given.<<ETX>>\",\"PeriodicalId\":248811,\"journal\":{\"name\":\"Records of the 1993 IEEE International Workshop on Memory Testing\",\"volume\":\"138 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-08-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Records of the 1993 IEEE International Workshop on Memory Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MT.1993.263149\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Records of the 1993 IEEE International Workshop on Memory Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MT.1993.263149","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 8

摘要

作者的研究取得了以下成果:(1)建立了将单比特移动测试转换为多比特移动测试的原始规则;(2)将新的多比特行军测试(使用表示嵌入式ram中的“串行访问”的“串行移位符号”)转换为串行访问的面向字的行军测试;(3)引入了一种新的紧凑表示法，该表示法扩展了已建立的march表示法，以包括具有两级for循环的算法(即:Galloping for循环和Hamming for循环)，因为此类算法对于定位单元阵列中的耦合故障和地址解码器中的卡开故障是必不可少的。最后，给出了故障定位算法的表格总结(使用“混合串行/并行”和“模块化”数据访问模式)

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Fault location algorithms for repairable embedded RAMs

The authors' research has led to: (1) the development of original rules for the conversion of single-bit march tests into multi-bit march tests; (2) the transformation of the new multi-bit march tests, using a 'serial shifting notation' which represents 'serial access' in embedded RAMs, into serial-access word-oriented march tests; and (3) the introduction of a new compact notation which extends the well-established march notation to include algorithms with two levels of FOR-loops (namely: the Galloping FOR-loop and the Hamming FOR-loop), since such algorithms are indispensible for locating coupling faults in cell arrays, and stuck-open faults in address decoders. Finally, a tabular summary (using both the 'hybrid serial/parallel' and the 'modular' data accessing modes) of fault location algorithms is given.<>

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Records of the 1993 IEEE International Workshop on Memory Testing

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