元胞自动机穷举双模式生成

Proceedings First Asian Test Symposium (ATS `92) Pub Date : 1992-11-26 DOI:10.1109/ATS.1992.224403

Sukumar Nandi, P. Chaudhuri, Swarup Roy, M. Sharma

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引用次数: 7

摘要

在组合电路中测试晶体管卡开故障或延迟故障需要两种模式。元胞自动机(CA)被提出作为一种双模式生成器。对于2n元CA结构，研究了产生所有可能的穷举双模式n位的条件。选择最理想的核证机关结构的准则亦已订明。

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Exhaustive two-pattern generation with cellular automata

Two-patterns are required to test a transistor stuck-open fault or a delay fault within a combinational circuit. Cellular automata (CA) has been proposed as a two pattern generator. For a 2n-cell CA structure, the condition to generate all possible exhaustive two-pattern n-bits have been investigated. Criteria to select the most desirable CA structure have also been laid down.<>

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Proceedings First Asian Test Symposium (ATS `92)

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