Fulvio Corno, G. Cumani, M. Reorda, Giovanni Squillero
{"title":"微处理器设计验证的演化测试程序归纳","authors":"Fulvio Corno, G. Cumani, M. Reorda, Giovanni Squillero","doi":"10.1109/ATS.2002.1181739","DOIUrl":null,"url":null,"abstract":"Design verification is a crucial step in the design of any electronic device. Particularly when microprocessor cores are considered, devising appropriate test cases may be a difficult task. This paper presents a methodology able to automatically induce a test program for maximizing a given verification metric. The methodology is based on an evolutionary paradigm and exploits a syntactical description of microprocessor assembly language and an RT-level functional model. Experimental results show the effectiveness of the approach.","PeriodicalId":199542,"journal":{"name":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"25","resultStr":"{\"title\":\"Evolutionary test program induction for microprocessor design verification\",\"authors\":\"Fulvio Corno, G. Cumani, M. Reorda, Giovanni Squillero\",\"doi\":\"10.1109/ATS.2002.1181739\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Design verification is a crucial step in the design of any electronic device. Particularly when microprocessor cores are considered, devising appropriate test cases may be a difficult task. This paper presents a methodology able to automatically induce a test program for maximizing a given verification metric. The methodology is based on an evolutionary paradigm and exploits a syntactical description of microprocessor assembly language and an RT-level functional model. Experimental results show the effectiveness of the approach.\",\"PeriodicalId\":199542,\"journal\":{\"name\":\"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).\",\"volume\":\"46 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-11-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"25\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2002.1181739\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02).","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2002.1181739","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Evolutionary test program induction for microprocessor design verification
Design verification is a crucial step in the design of any electronic device. Particularly when microprocessor cores are considered, devising appropriate test cases may be a difficult task. This paper presents a methodology able to automatically induce a test program for maximizing a given verification metric. The methodology is based on an evolutionary paradigm and exploits a syntactical description of microprocessor assembly language and an RT-level functional model. Experimental results show the effectiveness of the approach.