{"title":"基于双极器件识别技术的LSI版图检测","authors":"C. S. Chang","doi":"10.1109/DAC.1979.1600094","DOIUrl":null,"url":null,"abstract":"Layout errors often result in nonfunctioning devices that still adhere to all layout tolerance rules. Reported here is a method for locating such errors in addition to the tolerance rule checking.","PeriodicalId":345241,"journal":{"name":"16th Design Automation Conference","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1979-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":"{\"title\":\"LSI Layout Checking Using Bipolar Device Recognition Technique\",\"authors\":\"C. S. Chang\",\"doi\":\"10.1109/DAC.1979.1600094\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Layout errors often result in nonfunctioning devices that still adhere to all layout tolerance rules. Reported here is a method for locating such errors in addition to the tolerance rule checking.\",\"PeriodicalId\":345241,\"journal\":{\"name\":\"16th Design Automation Conference\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1979-06-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"13\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DAC.1979.1600094\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DAC.1979.1600094","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
LSI Layout Checking Using Bipolar Device Recognition Technique
Layout errors often result in nonfunctioning devices that still adhere to all layout tolerance rules. Reported here is a method for locating such errors in addition to the tolerance rule checking.