{"title":"黑色硅基虹膜,减少光散射和反射","authors":"Yousuf D. Almoallem, M. Moghimi, Hongrui Jiang","doi":"10.1109/OMN.2017.8051469","DOIUrl":null,"url":null,"abstract":"This paper reports the fabrication and the characterization of a black silicon based iris that shows significant reduction in the unwanted stray light due to scattering and reflection on the iris surfaces. The iris was characterized by recording the far-field diffraction pattern at a 532-nm wavelength. The intensity at dark rings is reduced by a factor of up to 5, which makes the bright 0th order disk much sharper.","PeriodicalId":411243,"journal":{"name":"2017 International Conference on Optical MEMS and Nanophotonics (OMN)","volume":"813 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Black silicon based iris with reduced light scattering and reflection\",\"authors\":\"Yousuf D. Almoallem, M. Moghimi, Hongrui Jiang\",\"doi\":\"10.1109/OMN.2017.8051469\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper reports the fabrication and the characterization of a black silicon based iris that shows significant reduction in the unwanted stray light due to scattering and reflection on the iris surfaces. The iris was characterized by recording the far-field diffraction pattern at a 532-nm wavelength. The intensity at dark rings is reduced by a factor of up to 5, which makes the bright 0th order disk much sharper.\",\"PeriodicalId\":411243,\"journal\":{\"name\":\"2017 International Conference on Optical MEMS and Nanophotonics (OMN)\",\"volume\":\"813 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 International Conference on Optical MEMS and Nanophotonics (OMN)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/OMN.2017.8051469\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 International Conference on Optical MEMS and Nanophotonics (OMN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OMN.2017.8051469","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Black silicon based iris with reduced light scattering and reflection
This paper reports the fabrication and the characterization of a black silicon based iris that shows significant reduction in the unwanted stray light due to scattering and reflection on the iris surfaces. The iris was characterized by recording the far-field diffraction pattern at a 532-nm wavelength. The intensity at dark rings is reduced by a factor of up to 5, which makes the bright 0th order disk much sharper.