Shoude Chang, Yanguang Zhang, Badrou-Réda Aich, Ye Tao
{"title":"印刷柔性FE存储器阵列测试系统","authors":"Shoude Chang, Yanguang Zhang, Badrou-Réda Aich, Ye Tao","doi":"10.1109/ESTC.2018.8546339","DOIUrl":null,"url":null,"abstract":"In this paper, a compact testing system is developed to read/write a printed flexible FE (Ferroelectric) memory arrays and evaluate individual FE capacitors. Novel technologies, to the best of our knowledge, for random cell accessing, reading/writing,and analyzing are achieved. This compact system (both hardware and software) is controlled by LabVIEW program installed in a Laptop,and is essentially multi-functional and programmable. This system is designed for writing/reading FE memory cells, individually or in batch, as well as analyzing and displaying FE memory.","PeriodicalId":198238,"journal":{"name":"2018 7th Electronic System-Integration Technology Conference (ESTC)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Printed Flexible FE Memory Array Testing System\",\"authors\":\"Shoude Chang, Yanguang Zhang, Badrou-Réda Aich, Ye Tao\",\"doi\":\"10.1109/ESTC.2018.8546339\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a compact testing system is developed to read/write a printed flexible FE (Ferroelectric) memory arrays and evaluate individual FE capacitors. Novel technologies, to the best of our knowledge, for random cell accessing, reading/writing,and analyzing are achieved. This compact system (both hardware and software) is controlled by LabVIEW program installed in a Laptop,and is essentially multi-functional and programmable. This system is designed for writing/reading FE memory cells, individually or in batch, as well as analyzing and displaying FE memory.\",\"PeriodicalId\":198238,\"journal\":{\"name\":\"2018 7th Electronic System-Integration Technology Conference (ESTC)\",\"volume\":\"43 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 7th Electronic System-Integration Technology Conference (ESTC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESTC.2018.8546339\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 7th Electronic System-Integration Technology Conference (ESTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESTC.2018.8546339","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this paper, a compact testing system is developed to read/write a printed flexible FE (Ferroelectric) memory arrays and evaluate individual FE capacitors. Novel technologies, to the best of our knowledge, for random cell accessing, reading/writing,and analyzing are achieved. This compact system (both hardware and software) is controlled by LabVIEW program installed in a Laptop,and is essentially multi-functional and programmable. This system is designed for writing/reading FE memory cells, individually or in batch, as well as analyzing and displaying FE memory.
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