高效功率器件的小信号阻抗分析

A. Tulbure, C. Huţanu, G. Brezeanu
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引用次数: 2

摘要

半导体阻抗是决定电子器件和电路性能的主要电气参数。由于这个原因,许多论文[1,][2],[3]讨论了半导体结的频率相关阻抗。这个贡献的主题是在0-100kHz之间的低频范围内的二极管和双极功率半导体器件(硅)的物理模型的研究。这一贡献的目标是通过实验测量证明,功率半导体的阻抗取决于信号频率,结的几何形状和电子结构的性质。本文介绍了一种计算等效半导体阻抗的方法,并通过实验进行了验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Small signal impedance analysis of high efficient power devices
The semiconductors impedance is a primary electrical parameter that determines the performance of electronic devices and circuits. For this reason many papers [1,] [2], [3] discus the frequency-dependent impedance of semiconductor junctions. Subject of this contribution is the investigation of physical model of the diode and bipolar power semiconductor devices (silicon) in the low frequency range between 0-100kHz. The goal of this contribution is to demonstrate through experimental measurements that the impedance of the power semiconductors depends on the signal frequency, junction's geometry and properties of the electronic structure. In the paper a procedure for computing the equivalent semiconductor impedance has been described and by experiments validated.
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