多态自检电路的物理演示

R. Ruzicka, L. Sekanina, R. Prokop
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引用次数: 45

摘要

多态门可以被认为是一种新的可重构技术,能够将逻辑功能和传感功能集成在一个单一的紧凑结构中。多态门是一类特殊的多态门,其逻辑功能可以由电源电压(Vdd)的电平来控制。提出了一种由Vdd控制的新型多晶NAND/NOR门。制作了该栅极,并将其应用于自检多态加法器中。本文给出了这种新实现的实验评估。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Physical Demonstration of Polymorphic Self-Checking Circuits
Polymorphic gates can be considered as a new reconfigurable technology capable of integrating logic functions with sensing in a single compact structure. Polymorphic gates whose logic function can be controlled by the level of the power supply voltage (Vdd) represent a special class of polymorphic gates. A new polymorphic NAND/NOR gate controlled by Vdd is presented. This gate was fabricated and utilized in a self-checking polymorphic adder. This paper presents an experimental evaluation of this novel implementation.
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