势塞贝克显微镜的应用综述

P. Ziółkowski, G. Karpinski, D. Platzek, C. Stiewe, E. Muller
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引用次数: 9

摘要

扫描电位塞贝克显微镜(PSM)不仅是研究热电材料性质的合适工具。DLR和Panco及其国家和国际合作伙伴成功完成的众多合作和项目显示了该测量仪器的广泛应用范围。该仪器的持续扩展应用和进一步发展记录在几篇出版物中[Platzek等人,2005年,Platzek等人,2005年,Chen等人,2005年,Ziolkowski等人,2006年,Platzek等人,2003年],显示了应用PSM取得的科学成果。鉴于迄今为止所取得的进一步发展和取得的结果,本工作将概述PSM的可能应用。这种多种多样的资料将标志着目前的发展状况,并将为今后要达到的目标提供前景
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Application Overview of the Potential Seebeck Microscope
The scanning Potential Seebeck Microscope (PSM) turned out to be a suitable tool to investigate material properties not only for thermoelectrics. Numerous cooperation and projects which were successfully accomplished by DLR and Panco and their national and international partners have shown the wide spectrum of application for this measurement instrument. The continuing extension of applications and further developments on this instrument were documented within several publications [Platzek, et al., 2005, Platzek, et al., 2005, Chen, et al., 2005, Ziolkowski, et al., 2006, Platzek, et al., 2003] showing the scientific output achieved by applying the PSM. With regard to the further developments which have been made and the results obtained so far, this work will give an overview of the possible applications of the PSM. This multiplexed informations will mark the present status of development and will give an outlook for further goals to reach
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