片上红外降的测量结果

Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285) Pub Date : 2002-08-07 DOI:10.1109/CICC.2002.1012897

Kazutoshi Kobayashi, Junji Yamaguchi, H. Onodera

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引用次数: 1

摘要

本文介绍了片上红外降的测量结果。在大规模集成电路中实现了红外降测量电路。它可以感知电源节点的电压降，从而改变参考电压和时钟时序。通过使用LSI测试仪的Shmoo绘图功能，可以自动获得测量波形。沿着VDD线测量两个不同的节点，可以成功地获得差分红外降波形。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Measurement results of on-chip IR-drop

This paper describes measurement results of on-chip IR-drop. An IR-drop measurement circuit is implemented in an LSI. It can sense the voltage drop of a power node to alter a reference voltage and clock timing. A measured waveform can be obtained automatically by using the Shmoo plot functionality of an LSI tester. Measuring two different nodes along a VDD line, differential IR-drop waveforms can be successfully obtained.

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Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)

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