球栅阵列封装的水分敏感性评价

L. Yip, T. Massingill, H. Naini
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引用次数: 8

摘要

由于对更高互连密度的需求不断增加,球栅阵列(BGA)封装越来越受欢迎。对于高I/O应用,塑料BGA (PBGA)和磁带BGA (TBGA)是细间距四平面封装和引脚网格阵列封装的有吸引力的替代品,因为它们的成本相对较低,易于表面贴装组装,并且电路板空间要求更小。然而,由于PBGA和TBGA是非密封封装,它们在表面贴装组装过程中容易受到湿气引起的损坏。研究了回流焊过程中水分对封装分层和开裂的影响,以及PBGA和TBGA封装的可靠性。基于扫描声学显微镜和可靠性应力测试的研究,如果遵循适当的存储和处理指南,PBGA和TBGA都可以安全地表面安装。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Moisture sensitivity evaluation of ball grid array packages
Ball Grid Array (BGA) packages have been gaining popularity due to the increasing demand for greater interconnect density. For high I/O applications, plastic BGA (PBGA) and tape BGA (TBGA) are attractive alternatives to fine-pitch quad flat pack and pin grid array packages because of their relative low cost, ease of surface mount assembly, and smaller board space requirement. However, since PBGA and TBGA are non-hermetic packages, they are vulnerable to moisture-induced damage during the surface mount assembly process. An evaluation was performed to investigate the impact of moisture on package delamination and cracking during the solder reflow process and the reliability of PBGA and TBGA packages. Based on our study using scanning acoustic microscopy and reliability stress tests, both PBGA and TBGA can be safely surface mounted if proper storage and handling guidelines are followed.
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