M. Achani, N. Bourzgui, J. Carru, A. Dégardin, A. Gensbittel, A. Kreisler
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引用次数: 0
摘要
本文研究了沉积在MgO单晶上的YBa 2 Cu 3 O 7-δ薄膜的λ和Zs的测定,在25k到300k的温度范围内进行了36ghz谐振锥形腔测量。讨论了这些结果与薄膜的直流电输运特性的关系,以及与沉积YBaCuO之前的衬底制备的关系。
Complete microwave characterization at 36 GHz of YBaCuO thin films deposited on MgO substrates. Influence of the substrate preparation
This paper deals with the determination of λ and Zs of YBa 2 Cu 3 O 7-δ thin films deposited on MgO single-crystals, from 36 GHz resonant conical cavity measurements performed in the 25 K to 300 K temperature range. The results are discussed in relation with DC electrical transport properties of the films and also with substrate preparation prior to YBaCuO deposition.